Spectral Range
1.7 - 10 keV
Techniques
Spectroscopy
- XAS/XANES/XAFS
Imaging
- Micro XAFS/XRD/XRF Imaging
Samples
SXRMB supports a variety of sample types at four endstations:
| Endstation | Sample Type |
| Solid state endstation | Powders, bulk samples, foils, and thin films |
| Microprobe endstation | Thin layer, films, and powders |
| Ambient table | Solids, liquids (in situ experiments available) |
| High energy XPS | Thin films |
Specifications
| CLS Port | 06B1-1 | |
| Source | Bending Magnet | |
| Resolution | 3.3x10-4 Insb, 10-4 Si (111) |
|
| Spot Sizes | ~1 mm x 4 mm |
~10 µm × 10 µm |
| Focusing | Torroidal Mirror | K-B Mirror Pair |
| Photon Flux
(g/s/0.1%BW) @ 100 mA |
1.0 × 109- 1.0 × 1011 |
Contact
Mohsen Shakouri Scientist, Beamline Responsible (SXRMB)
Visit the SXRMB website for a full list of beamline contacts.
Beamline Video
Access
Purchased Access
Purchased access offers quick and accurate solutions to proprietary questions. CLS scientists develop an experimental plan based on the client’s needs, and conduct all data collection and analysis, resulting in a detailed report with key answers to critical questions.
Peer-Reviewed Access
Academic clients can submit proposals through a peer review process. Beam time is granted based on scientific merit, with the expectation that any results will be published. In special cases, rapid access is also available for instrument or beam time.