VLS-PGM - Variable Line Spacing Plane Grating Monochromator Beamline
Facilitating research in materials of both fundamental and applied nature, the VLS-PGM beamline provides high resolution, low energy spectroscopic studies. We invite users and collaborators to discuss their proposal with the Beamline Staff before submission. This is crucial for a careful assessment of the experiment feasibility.
Spectral Range
15-250 eV
An Elliptical Polarized Undulator provides an intense beam in the 15-250 eV energy range with user-specified polarization (varying from linear polarization to circular polarization). Please contact VLS-PGM staff to discuss your specific experiment needs.
Techniques
Samples
VLS-PGM supports material samples in a variety of forms, including thin films, pressed pellets, metal chunks, and powders. The sample size should be kept to a minimim, with the maximum size not exceeding 10mm x 10 mm in area and must be stable in ultra high vacuum. VLS-PGM offers some sample temperature control. Please contact VLS-PGM staff to discuss your specific experiment needs.
Detailed sample powder preparation information is available on the VLS-PGM user guide.
Specifications
| CLS Port | 11ID-2 |
| Source | Elliptically Polarizing Undulator |
| Resolution | >10000 |
| Spot Sizes |
Branch A < 500 μm x 500 μm |
| Photon Flux |
>2 x 1011 at 200mA ring current, measured with 50 μm x 50 μm slits |
Contacts
Lucia Zuin
Senior Scientist, Beamline Responsible (VLS-PGM)
Andrew Grosvenor VLS-PGM Beamline Advisory Team Leader
Visit the VLS-PGM website for a full list of beamline contacts.
News Highlights
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Access
Purchased Access
Purchased access offers quick and accurate solutions to proprietary questions. CLS scientists develop experimental plans based on clients' needs, collect and analyze data, and provide detailed reports with key answers to critical questions.
Peer-Reviewed Access
Academic clients can submit proposals through a peer review process. Beam time is granted based on scientific merit, with the expectation that any results will be published. In special cases, rapid access is also available for instrument or beam time.