- Grazing Incidence X-ray Absorption Spectroscopy (GI-XAFS)
Diffraction & Scattering
- Grazing Incidence X-ray Diffraction (GIXRD)
- X-ray Laue Diffraction
Imaging & Microscopy
- Fluorescence Microscopy
- Micro XAFS/XRD/XRF Imaging
- Differential Aperture X-ray Microscopy (DAXM)
Samples for XRF/XRD mapping should ideally be thin, flat, uniform in thickness, and have a smooth surface. However, if the concentration level is low for the element of interest, thicker samples may be needed to obtain reasonable signals.
Several different shaped mounting pieces with magnetic mounting bases are available on the beamline. Usually, the sample needs to be stuck onto those pieces for mounting. It may help if the sample is pre-mounted on a metal-free (especially free of elements of interest) slide for XRF, and amorphous (diffraction free) slide for XRD. At the beamline, there are Kapton tapes and metal-free plastic slides available for use.
|Resolution||Si-111: 10⁻⁴, MLM1: 10⁻² , MLM2: 10⁻¹, Polychromatic Beam (Pink Beam)|
|Spot Sizes||2 μm to 4 μm (mm-sized beam also available)|
||Si-111: 2x10⁹, MLM1: 1x10¹¹, MLM2: 4x10¹¹ (@15 keV and 100 mA)|
Purchased access offers quick and accurate solutions to proprietary questions. CLS scientists develop an experimental plan based on the client’s needs, and conduct all data collection and analysis, resulting in a detailed report with key answers to critical questions.
Academic clients can submit proposals through a peer review process. Beam time is granted based on scientific merit, with the expectation that any results will be published. In special cases, rapid access is also available for instrument or beam time.