REIXS - Resonant Elastic and Inelastic X-ray Scattering
A state-of-the-art soft X-ray scattering facility featuring high flux, high resolution and full polarization control. Suitable for studying novel and advanced quantum materials, including strongly correlated electron systems, spintronic materials, high Tc superconductor, nano-scale biomaterials, and more.
Spectral Range
Techniques
Scattering
- Resonant Soft X-ray Scattering (RSXS)
Spectroscopy
- Resonant Inelastic X-ray Scattering (RIXS)
- X-ray Magnetic Circular Dichroism (XMCD)
- X-ray Magnetic Linear Dichroism (XMLD)
For detailed information about REIXS techniques, visit reixs.lightsource.ca.
Samples
REIXS supports material samples in a variety of forms, including thin films, single crystals, and powders. Sample size should be kept to a minimum with the maximum size not exceeding 10 mm X 10 mm in area and must be stable in ultra high vacuum. REIXS offers a range of sample temperatures and magnetic fields up to 0.7 T.
Please contact REIXS staff to discuss you specific experiment needs. More sample information is available on the REIXS website.
Specifications
| CLS Port | 10ID-2 |
| Source | 75 mm generalized Apple II Elliptically Polarizing Undulator (EPU) |
| Resolution | 5x10-5 @ 100 eV 1.3x10-4 @ 1000 eV |
| Spot Sizes | RSXS: 250μm × 150μm RIXS: 50μm × 10μm |
| Photon Flux (γ/s/0.1%BW) @ 100 mA |
1 x 1012 @ 100 eV 5 x 1011 @ 1000 eV |
Contact
Teak Boyko
Senior Scientist, Beamline Responsible (REIXS)
Beamline Advisory Team Members:
David Hawthorn 519-888-4567 x38589
Alex Moewes 306-966-6431
Visit the REIXS website for a full list of beamline contacts.
Beamline Video
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Access
Purchased Access
Purchased access offers quick and accurate solutions to proprietary questions. CLS scientists develop experimental plans based on clients' needs, collect and analyze data, and provide detailed reports with key answers to critical questions.
Peer-Reviewed Access
Academic clients can submit proposals through a peer review process. Beam time is granted based on scientific merit, with the expectation that any results will be published. In special cases, rapid access is also available for instrument or beam time.