- Resonant Soft X-ray Scattering (RSXS)
- Resonant Inelastic X-ray Scattering (RIXS)
- X-ray Magnetic Circular Dichroism (XMCD)
- X-ray Magnetic Linear Dichroism (XMLD)
For detailed information about REIXS techniques, visit reixs.lightsource.ca.
REIXS supports material samples in a variety of forms, including thin films, single crystals, pressed pellets, metal chunks, and powders. Sample size should be kept to a minimum with the maximum size not exceeding 10 mm X 10 mm in area and must be stable in ultra high vacuum. REIXS offers a range of sample temperatures 20 – 450 K and magnetic fields up to 0.7 T.
Please contact REIXS staff to discuss you specific experiment needs. More sample information is available on the REIXS website.
|Source||75 mm generalized Apple II Elliptically Polarizing Undulator (EPU)|
|Resolution||5x10-5 @ 100 eV
1.3x10-4 @ 1000 eV
|Spot Sizes||RSXS: 250μm × 150μm
RIXS: 50μm × 10μm
(γ/s/0.1%BW) @ 100 mA
|1 x 1012 @ 100 eV
5 x 1011 @ 1000 eV
Purchased access offers quick and accurate solutions to proprietary questions. CLS scientists develop an experimental plan based on the client’s needs, and conduct all data collection and analysis, resulting in a detailed report with key answers to critical questions.
Academic clients can submit proposals through a peer review process. Beam time is granted based on scientific merit, with the expectation that any results will be published. In special cases, rapid access is also available for instrument or beam time.