HXMA - Hard X-ray Micro-Analysis Beamline

HXMA can be used to study the elemental local structure environment of materials in-situ and ex-situ, accommodating bulk and thin film samples.

Spectral Range

5 – 40 keV



  • Grazing Incidence X-ray Absorption Spectroscopy (GI-XAFS)


For transmission mode, powder samples can be prepared into pressed pellets on-site. HXMA also has a liquid helium cryostat for certain XAFS experiments.


CLS Port 06ID-1
Source Superconducting Wiggler
Resolution 10-4 
Spot Sizes 0.8 mm x 1.5 mm
Photon Flux
1012 @ 12 keV​


Senior Scientist - Beamline Responsible: 
Ning Chen 306-657-3571

Beamline Advisor Team Leader:
De-Tong Jiang

For a full contact list, visit the HXMA Website.


Purchased Access

Purchased access offers quick and accurate solutions to proprietary questions. CLS scientists develop an experimental plan based on the client’s needs, and conduct all data collection and analysis, resulting in a detailed report with key answers to critical questions.

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Peer-Reviewed Access

Academic clients can submit proposals through a peer review process. Beam time is granted based on scientific merit, with the expectation that any results will be published. In special cases, rapid access is also available for instrument or beam time.

Proposal Submission