Very Sensitive Elemental and Structural Probe Employing Radiation from a Synchrotron


VESPERS is a hard X-ray microprobe capable of providing a high level of complementary structural and analytical information. The techniques of X-ray diffraction and X-ray fluorescence spectroscopy are employed to analyze a microscopic volume in the sample. Multi-bandpass and pink beam capability are built in to meet variable requirements.

The beamline is currently accepting proposals for micro-diffraction and micro-fluorescence experiments for the coming cycle, as well as XANES (X-ray absorption near edge structure) and differential aperture X-ray microscopy. The beamline is capable to provide the beam with different bandwidths of 0.01%, 1.6%, 10%, and the pink beam. mm-sized beam will also be available for XRF and XANES measurements.

Please discuss details of your proposal with the beamline scientist prior to submitting your proposal.

  • Status

    Accepting Proposals


    Bending Magnet

  • Energy Range

    6 – 30 keV

  • Resolution Δ E / E @ E

    Si(111) – 10-4
    MLM2 – 10-1
    MLM1 – 10-2
    Pink Beam

  • Flux (γ/s/0.1%BW) @ 100 mA

    Si-111 ~ 2 x 109 @ 15 keV
    MLM1 ~ 1 x 1011 @ 15 keV
    MLM2 ~ 4 x 1011 @ 15 keV

  • Spot size (Horizontal x Vertical)

    (2 – 4) μm x (2 – 4) μm

VESPERS Endstation Capabilities

  • Microprobe
  • Diffraction (CCD Camera)
  • Fluorescence (Solid State Detector)
  • Ion Chambers
  • Energy range: 6-30 keV
  • Beam size:
    • Micro beam: 2-4 micron
    • Big beam: ~1 mm
  • X-ray Laue diffraction and mapping(Pilatus pixel area detector)
  • X-ray diffraction with transmission geometry (Pilatus pixel area detector)
  • X-ray fluorescence spectroscopy and mapping (Vortex silicon drift detector)
  • X-ray absorption near edge structure  (fluorescence and transmission modes)
  • Differential aperture X-ray microscopy
  • Multi-bandpass and pink beam capability


  • Microprobe
  • X-ray Laue Diffraction
  • X-ray Fluorescence Spectroscopy
  • X-ray Absorption Near Edge Structure
  • Differential Aperture X-ray Microscopy
  • Multi-Bandpass and Pink Beam capability


Compounding focusing, multi-stripe mirrors, crystal and multilayer monochromator, KB mirrors


Senior Scientist: Renfei Feng 306-657-3581
Associate Scientist: Peter Blanchard 306-657-3817
Beamline Telephone: 306-657-3620

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