SXRMB (06B1-1)

• Status

  Accepting Proposals

• Endstations

  XAFS
  Microprobe
  High Energy XPS

• Energy Range (keV)

  1.7 - 10

• Wavelength (Å)

  7.3 - 1.3

• Resolution Δ E/E @ E

  InSb (111): 3.3 x 10^-4
  Si (111): 1.0 X 10⁴

• Flux (g/s/0.1%BW) @ 100 mA

  >1.0 × 10¹¹

• Spot Size (H × V)

  ~1 mm × 4 mm

• Focusing

  Torroidal Mirror

Contacts

Scientist, Beamline Responsible: Mohsen Shakouri 306-657-3551
Scientist: Qunfeng Xiao 306-657-3833
 

SXRMB XAS Endstation Capabilities (under vacuum or ambient conditions):

• Total electron yield (sample drain current measurement)
• Si(Li) drift solid state fluorescence measurement
• Transmission yield
• X-ray Excited Optical Luminescence (XEOL)
• Multiple samples can be run both under vacuum and in inert gas filled configurations
• Microprobe
• High energy XPS