High Resolution Spherical Grating Monochromator


The beamline employs three diffraction gratings to provide users with a very bright, highly monochromatic photon beam, tunable between 250 and 2000 eV. The beamline is ideal for solid sample or gas phase spectroscopy but can be fitted with a variety of endstations.

The SGM beamline provides photons between 250 eV and 2000 eV for X-ray Absorption Spectroscopy (XAS) and X-ray Photoelectron Spectroscopy (XPS) experiments in two in-line endstations. The energy resolution of the beamline is as high as 50 meV at the C K-edge and the current beam spot size is 1000 x 100 microns in the XPS endstation and as small as 10 x 10 microns in the XAS endstation.

Please discuss details of your proposal with the beamline scientist prior to submitting your proposal.

  • Status

    Accepting Proposals

  • Spot size (Horizontal x Vertical)

    1000 μm x 100 μm

  • Wavelength

    62 – 6.5Å

  • Resolution E/Δ E

    >5000 (below 1500 eV)

  • Source

    45 mm planar undulator

  • Flux (γ/s/0.1%BW) @ 100 mA

    4x1012 @ 250 eV
    > 1 x1011@ 1900 eV

  • Energy Range

    250 – 2000 eV


Senior Scientist - Beamline Responsible: Tom Regier 306-657-3733
Associate Scientist: Jay Dynes 306-657-3840
Support Scientist: Zachary Arthur 306-657-3708
Beamline Team Leader: T.K. Sham
Beamline Team Members (PDF)
Beamline Telephone: 306-657-3612


Two horizontal deflecting mirrors and one vertical focusing mirror direct the light from the undulator through the entrance slit and onto the selected grating. The three gratings, with line spacing of 600, 1100 and 1700 lines/mm, diffract the light through a movable exit slit. A pair of toroidal refocusing mirrors are used to focus the beam onto the sample areas.


  • Auger Electron Spectroscopy (AES) or Partial Electron Yield (PEY)
  • X-ray Absorption Spectroscopy (XAS) with Partial Fluorescence Yield (PFY)
  • X-ray Excited Optical Luminescence (XEOL)
  • X-ray Photoelectron Spectroscopy (XPS)

SGM Endstations and Capabilities

  • Ambient Pressure X-ray Absorption Spectroscopy (APXAS) -The ambient pressure endstation with microfocussing optics can allow for measurement of x-ray absorption spectroscopy (XAS) and x-ray fluorescence (XRF) mapping on samples in a controlled atmosphere. This endstation employs a Kirkpatrick-Baez mirror system for control of the beamspot size down to 10 x 10 microns and as large as 500 x 500 microns. An array of silicon drift detectors is used for energy resolved fluorescence yield measurements. XRF mapping of light elements is possible and liquid cell operations are available. Please contact the beamline scientist to discuss details regarding the measurement pressures and gas compositions available.
  • X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) - The SGM photoemission endstation is now equipped with both a SES-100 photoelectron energy analyzer and a silicon drift detector. Both high and low temperature experiments are possible with this chamber but UHV compatible samples are required. Total energy resolution (analyzer + beamline) of 100 meV is easily obtainable. The beamline software is integrated with the Scienta control software to allow for Constant Initial State (CIS) and Constant Final State (CFS) measurements.
  • University of Saskatchewan researchers Courtney Phillips (right) and Derek Peak (middle), along with the CLS Spherical Grating Monochromator (SGM) beamline scientist, Tom Regier.

  • from left: Marco Keiluweit, University of Massachusetts-Amherst, Jay Dynes, CLS, and Michael Schaefer, Standford on SGM

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