HXMA (06ID-1)

• Status

  Accepting Proposals

• Source

  Superconducting Wiggler

• Energy Range

  5-40 keV

• Resolution ΔE/E

  10^-4

• Flux (y/s/0.1%BW) @ 100 mA

  XAFS, Diffraction: 10¹² @ 12 keV

• Spot Size (HxV)

  XAFS, Diffraction: 0.8mm x 1.5 mm²

Contacts

Senior Scientist - Beamline Responsible: Ning Chen 306-657-3571
Senior Scientist: Chang-Yong Kim 306-657-3765
Support Scientist: Weifeng Chen 306-657-3829 
Beamteam Leader: De-Tong Jiang 
Beamline Telephone: 306-657-3611
 

Optics

The primary beamline optics include a 1.2 m water-cooled silicon collimating mirror (seperate Rh and Pt coating stripes), a liquid nitrogren cooled double crystal monochromator (Kohzu CMJ-1) housing two crystal pairs [Si (111) and Si (220)], and a 1.15 m long water-cooled silicon toroidal focusing mirror (separate Rh and Pt coating stripes). These mirrors are equipped with dynamical meridian benders. 
 

HXMA Endstations and Capabilities

• X-ray Absorption Fine Structure (XAFS): ionization chamber detectors and fluorescence detectors (i.e., Lytle, 4 element vortex, and 30 element Ge detector) for standard transmission and fluorescence mode EXAFS; cryostats for variable temperature sample environment (10 K - 300 K).
• Powder X-ray diffraction: high pressure and ambient condition powder diffraction with MAR345 image plate area detector;
• X-ray diffraction (XRD):  Resonance X-ray Diffraction (RXD); Polarization Analysis; Grazing Incidence X-ray Diffraction (GIXRD); Grazing Incidence Small Angle X-ray Scattering (GISAXS). Available equipments are Huber psi-8 diffractometer, CCD X-ray detector,  Four element Vortex silicon drift detector, closed cycle cryostat (10 K - 450 K), Be-dome (UHV - ambient pressure, 300 K - 800 K), in-situ flow-reactor/furnace cell (300K – 1200 K), heating-cooling stage (80 K - 620 K).

Please discuss details of your experiment(s) prior to submitting with Ning Chen, 306-657-3571 (XAFS capabilities) and Chang-Yong Kim, 306-657-3765 (X-ray Diffraction).