Brockhouse X-ray Diffraction and Scattering Beamlines - Undulator Beamline


Brockhouse is a suite of 3 beamlines dedicated to using hard X-rays for diffraction and scattering techniques for material science. Two beamlines have a wiggler source and the third beamline has an undulator source. Brockhouse offers a wide range of complementary techniques for structural characterization, including high resolution powder diffraction, small molecule crystallography, total scattering to produce the pair distribution function, micro-single crystal diffraction, high pressure setups, anomalous/magnetic diffraction, low angle X-ray reflectivity, grazing incidence diffraction, and inelastic scattering. There is also a highly specialized station from IBM that allows diffraction experiments with temperature control up to 1100°C, ultra-high pure N2 or He atmospheres, and in-situ roughness and resistance probes for the characterization of thin films.

  • Status

    Accepting Letter of Intent (Rapid Access)

  • Energy Range

    5 – 24 keV

  • Flux

    1014 – 1012 ph/sec

  • Resolution

    1% bandwidth with the multilayer monochromator, 0.01% with the channel cut monochromator

  • Focus Size

    15 μm vertical x 170 μm horizontal (theoretical)


  • Double multilayer monochromator (1% energy bandwith)
  • Optional channel cut monochromator, Si111 (0.01% energy bandwidth)
  • Horizontally focusing mirror
  • Vertically focusing mirror


  • Newport Kappa diffractometer (under commissioning)
  • SAXS (future)


  • Grazing Incidence X-ray Diffraction (GIXRD)
  • Single-crystal X-ray Diffraction
  • Small Angle X-ray Reflectivity
  • Anomalous Diffraction - under commissioning
  • Magnetic Diffraction - under commissioning
  • SAXS - future technique


Beatriz Moreno - 306-657-3868

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