Brockhouse X-ray Diffraction and Scattering Beamlines - High Energy Wiggler


Brockhouse is a suite of 3 beamlines dedicated to using hard X-rays for diffraction and scattering techniques for material science. Two beamlines have a wiggler source and the third beamline has an undulator source. Brockhouse offers a wide range of complementary techniques for structural characterization, including high resolution powder diffraction, small molecule crystallography, total scattering to produce the pair distribution function, micro-single crystal diffraction, high pressure setups, anomalous/magnetic diffraction, low angle X-ray reflectivity, grazing incidence diffraction, and inelastic scattering. There is also a highly specialized station from IBM that allows diffraction experiments with temperature control up to 900-1000°C, ultra-high pure N2 or He atmospheres, and in-situ roughness and resistance probes for the characterization of thin films.

  • Status


  • Energy

    20 – 94keV (0.61 – 0.13 Angstrom)

  • Beam Size

    2 – 10 mm horizontal, ~100 μm vertical

  • Energy Resolution

    Δ d/d = 10-3  

  • Flux

    5x109 to 2x1013


  • Laue monochromator
  • Crystals in the monochromator: Silicon, hkl 111, 422, 533


  • Several sample stages under commissioning: multicapillary sample stage, Kozhu stage stack.
  • PerkinElmer area detector, 200 μm pixel, 40 x 40 cm2 area.


  • Pair distribution function
  • High pressure diffraction with DAC
  • 3D grain mapping - under commissioning


Graham King - 306-657-3760

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