Brockhouse X-ray Diffraction and Scattering Beamlines - Low Energy Wiggler

Overview

Brockhouse is a suite of 3 beamlines dedicated to hard X-ray diffraction and scattering techniques for material science. The suite offers a wide range of complementary techniques for structural characterization.

The Brockhouse Low Energy Wiggler beamline is one of the latest beamlines at CLS and is now in general user operation. Three endstations operate at fixed photon energies, providing techniques including high resolution powder diffraction, small molecule crystallography, X-ray reflectivity and grazing incidence diffraction.

The three endstations can accept a wide variety of sample types: From specially prepared planar thin films only a few atoms thick, and delicate single crystals, to powders of ground flax straw, or a piece of chocolate. A growing list of sample environments are available, including temperature control, ultra-high purity gas atmospheres, and gas/liquid flow cells.

Please discuss details of your proposal with beamline staff prior to submitting

  • Status

    Accepting proposals

  • Source

    In-vacuum wiggler, 80 mm period

  • Energy Range

    Si (111) 7 - 16 keV
    Si (311) 13 - 22 keV

  • Spot Size

    <150 µm V × <500 µm H FWHM over the full energy range

  • Flux

    Low to mid 10^12 photons/s, in focus on the sample at 220 mA ring current

  • Energy Resolution ΔE/E

    Si (111): 2.8 × 10-4 at 7.1 keV to 6.4 × 10-4 at 15.9 keV
    Si (311): 2.5 × 10-4 at 12.9 keV to 4.5 × 10-4 at 22.5 keV

Optics

  • High heat load graphite filters and slits
  • Toroidal first mirror, collimating in the horizontal and focusing in the vertical to the sample location
  • Cryo-cooled Bragg single side bounce monochromator, with choice of Si (111) or Si (311) crystal
  • Cylindrical second mirror, focusing in the horizontal to the sample location
 

Endstations

  • Huber endstation, 15.1 keV:
    • Optimized for high resolution powder diffraction, but with great flexibility to accommodate a variety of experiments including reflectometry, reciprocal space mapping and GISAXS/WAXS
    • Mythen 1K linear or Rayonix MX300 area detectors
    • High temperature gas/liquid flow cell, He cryostat (10 K) with Be dome, Oxford Cryostream Plus (80 - 500 K), multi-sample changers, etc.
  • IBM endstation, 7.9 or 15.1 keV:
    • Optimized for in-situ rapid thermal annealing (1273 K) experiments on thin films and multilayer structures under ultra-high purity N2 or He atmospheres.
    • Hermes linear detector. In-situ roughness and resistance probes
  • Bruker endstation, 9.5 or 18 keV:
    • Optimized for single crystal measurements especially small molecule structure determination
    • APEXII area detector. Oxford Cryostream Plus (80 - 500 K)
 

Techniques

  • High-resolution X-ray powder diffraction
  • Small molecule crystallography
  • In-situ diffraction with rapid thermal annealing (IBM station)
  • X-ray reflectivity
  • Grazing incidence X-ray diffraction (GIXRD, GISAXS)
  • Small and wide angle X-ray scattering (SAXS/WAXS)
 

Contacts

BXDS-WLE Beamline Telephone: 306-657-3821
 
Scientist, Beamline Responsible: Beatriz Diaz Moreno 306-657-3868
Senior Scientist: Chang-Yong Kim 306-657-3765
Scientist: Graham King 306-657-3760
Associate Scientist: Adam Leontowich 306-657-3555
Associate Scientist: Narayan Appathurai 306-657-3648
Associate Scientist: Al Rahemtulla 306-657-3530
Beamline Team Leader: Stefan Kycia, University of Guelph

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