Beamlines

The Canadian Light Source facility consists of a 2.9 GeV storage ring and a linear accelerator that serves as an injector to the rings. The ring has a circumference of 170.88m, with a maximum current of 220 mA. Its horizontal emittance is 18 nm-rad, with an approximate vertical emittance of .09 nm-rad.

  • BeamlineDown Arrow

    Techniques

    Energy (eV) (cm -1 for IR) Up Arrow

    Beamline Contact

  • APS – Other Beamlines

    Beamlines include all XSD beamlines at the APS — please contact the CLS@APS staff for more information

    Various

  • BXDS-IVU
    Brockhouse X-ray Diffraction and Scattering Beamlines - Undulator Beamline

    • Diffraction Anomalous Fine Structure (DAFS)
    • Grazing Incidence X-ray Diffraction (GIXRD)
    • Reciprocal Space Maps
    • Resonant/Anomalous/Magnetic Diffraction
    • Single-Crystals / Thin Films X-ray Diffraction
    • Small & Wide Angle X-ray Scattering (SAXS/WAXS)
    • Small Angle X-ray Reflectivity

     

     

    5 – 21 keV

  • REIXS (10ID-2)
    Resonant Elastic and Inelastic X-ray Scattering

    • Resonant Inelastic X-ray Scattering (RIXS)
    • Resonant Soft X-Ray Scattering (RSXS)
    • X-ray Absorption Fine Structure (XAFS)
    • X-ray Absorption Near Edge Structure (XANES)
    • X-ray Absorption Spectroscopy (XAS)
    • X-ray Emission Spectroscopy (XES)
    • X-ray Excited Optical Luminescence (XEOL)
    • X-ray Magnetic Circular Dichroism (XMCD)
    • X-ray Magnetic Linear Dichroism (XMLD)

    90 - 2000 eV

  • BXDS-WLE
    Brockhouse X-ray Diffraction and Scattering Beamlines - Low Energy Wiggler

    • Grazing Incidence X-ray Diffraction (GIXRD, GISAXS)
    • High-Resolution X-ray Powder Diffraction
    • In-situ Diffraction with Rapid Thermal Annealing
    • Single Crystal Small Molecule Crystallography
    • Small & Wide Angle X-ray Scattering (SAXS/WAXS)
    • X-ray Reflectivity

    7 - 22 keV

  • VESPERS (07B2-1)
    Very Sensitive Elemental and Structural Probe Employing Radiation from a Synchrotron

    • Differential Aperture X-ray Microscopy (DAXM)
    • Fluorescence Microscopy
    • Grazing Incidence X-ray Absorption Spectroscopy (GI-XAFS)
    • Grazing Incidence X-ray Diffraction (GIXRD)
    • Micro XAFS/XRD/XRF Imaging
    • White Beam Access
    • X-ray Absorption Fine Structure (XAFS)
    • X-ray Absorption Near Edge Structure (XANES)
    • X-ray Absorption Spectroscopy (XAS)
    • X-ray Diffraction (XRD)
    • X-ray Excited Optical Luminescence (XEOL)
    • X-ray Fluorescence Spectroscopy (XRF)
    • X-ray Laue Diffraction

    6000 – 30000

  • CMCF-ID (08ID-1)
    Canadian Macromolecular Crystallography Facility

    • Macromolecular Crystollography (MX)
    • Single-crystal X-ray Diffraction

    Critical Points to Address in a CMCF Proposal

    6000 – 18000

  • BioXAS-Spectroscopy (07ID-2)
    High-Sensitivity X-ray Absorption Spectroscopy

    • X-ray Absorption Fine Structure (XAFS)
    • X-ray Absorption Near Edge Structure (XANES)
    • X-ray Absorption Spectroscopy (XAS)

    5000-32000

  • BioXAS-Imaging (07ID-1)
    BioXAS-Imaging

    • X-ray Absorption Spectroscopy (XAS) in situ
    • X-ray Fluorescence Imaging

    5000-21000

  • HXMA (06ID-1)
    Hard X-ray MicroAnalysis

    • Grazing Incidence X-ray Absorption Spectroscopy (GI-XAFS)
    • High Pressure XANES
    • X-ray Absorption Fine Structure (XAFS)
    • X-ray Absorption Near Edge Structure (XANES)
    • X-ray Absorption Spectroscopy (XAS)

    5000 – 40000

  • VLS-PGM (11ID-2)
    Variable Line Spacing Plane Grating Monochromator

    • X-ray Absorption Fine Structure (XAFS)
    • X-ray Absorption Near Edge Structure (XANES)
    • X-ray Absorption Spectroscopy (XAS)
    • X-ray Excited Optical Luminescence (XEOL)

    Critical Points to Address in a VLS-PGM Proposal

    Example VLS-PGM Proposal

    5.5 – 250

  • CMCF-BM (08B1-1)
    Canadian Macromolecular Crystallography Facility

    • Macromolecular Crystollography (MX)
    • Powder Diffraction/Scattering
    • Single-crystal X-ray Diffraction
    • XANES on crystals

    Critical Points to Address in a CMCF Proposal

    4000 - 18000

  • APS – Beamline 20-ID-B,C: Sector 20 – Insertion Device

    • Confocal X-ray Microscopy
    • Micro XAFS/XRD/XRF Imaging
    • Resonant X-ray Emission Spectroscopy (XES)
    • Time-resolved X-ray Absorption Fine Structure
    • X-ray Absorption Fine Structure (XAFS)
    • X-ray Raman Scattering (XRS)

    4.3 – 27 keV (Si111) 8 – 50 keV (Si311)

  • BMIT-ID (05ID-2)
    Biomedical Imaging and Therapy

    • Absorption and propagation based phase-contrast
    • Computed (micro)Tomography (µCT) and radiography including propagation-based phase-contrast
    • Irradiation experiments
    • K-edge Subtraction Imaging (KES)

    Critical Points to Address in a BMIT Proposal

    30000 - 140000

  • SGM (11ID-1)
    High Resolution Spherical Grating Monochromator

    • Auger Electron Spectroscopy (AES)
    • Micro XAFS/XRF Imaging
    • X-ray Absorption Fine Structure (XAFS)
    • X-ray Absorption Imaging
    • X-ray Absorption Near Edge Structure (XANES)
    • X-ray Absorption Spectroscopy (XAS)
    • X-ray Excited Optical Luminescence (XEOL)
    • X-ray Fluorescence Spectroscopy (XRF)
    • X-ray Photoelectron Spectroscopy (XPS)

    240 - 2000

  • BXDS-WHE
    Brockhouse X-ray Diffraction and Scattering Beamlines - High Energy Wiggler

    • Anomalous Diffraction
    • Pair Distribution Function (PDF)
    • Powder Diffraction/Scattering

    20 – 94keV (0.61 – 0.13 Angstrom)

  • APS – Beamline 20-BM-B: Sector 20 – Bending Magnet

    • Diffraction Anomalous Fine Structure (DAFS)
    • Microfluorescence (μXRF)
    • Time-resolved X-ray Excited Optical Luminescence (XEOL)
    • X-ray Absorption Fine Structure (XAFS)

    2.7 – 32.7 keV

  • SXRMB (06B1-1)
    Soft X-ray Microcharacterization Beamline

    • Angle-Resolved Photoemission Spectroscopy (ARPES)
    • Micro XAFS/XRD/XRF Imaging
    • X-ray Absorption Fine Structure (XAFS)
    • X-ray Absorption Near Edge Structure (XANES)
    • X-ray Absorption Spectroscopy (XAS)
    • X-ray Excited Optical Luminescence (XEOL)
    • X-ray Photoelectron Spectroscopy (XPS)

    1700 – 10000

  • QMSC (09ID-1)
    Quantum Materials Spectroscopy Centre

    • Angle-Resolved Photoemission Spectroscopy (ARPES)
    • Spin resolved momentum distribution curves

    15-1200 eV

  • SM (10ID-1)
    Soft X-ray Spectromicroscopy

    • Cryo-Scanning Transmission X-ray Microscopy (Cryo-STXM)
    • NEXAFS Spectromicroscopy - STXM XRF mode
    • Photoemission Electron Microscopy (PEEM)
    • Scanning Transmission X-ray Microscopy (STXM)
    • Soft X-ray Tomography
    • STXM-Ptychography
    • X-ray Magnetic Circular Dichroism (XMCD)
    • X-ray Magnetic Linear Dichroism (XMLD)

    Critical Points to Address in an SM Proposal

    130 – 2700

  • BMIT-BM (05B1-1)
    Biomedical Imaging and Therapy

    • Absorption and propagation based phase-contrast
    • Analyzer crystal-based imaging (DEI, USAXS)
    • Computed (micro)Tomography (µCT) and radiography including propagation-based phase-contrast
    • K-edge Subtraction Imaging (KES, SKES)
    • Rocking-curve imaging
    • Ultrafast/time-resolved CT and radiography
    • White Beam Access

    Critical Points to Address in a BMIT Proposal

    12600-40000

  • SyLMAND (05B2-1)
    Synchrotron Laboratory for Micro And Nano Devices

    • Deep X-ray lithography
    • LIGA Process

    1000 – 15000

  • Mid-IR (01B1-1)
    Mid Infrared Spectromicroscopy

    • ATR Infrared Spectroscopy
    • Chemical Infrared Imaging
    • Fourier Transform Infrared Spectroscopy (FTIR)
    • FTIR Spectromicroscopy
    • Techniques Under Development:
      • ATR Infrared Chemical Imaging


    Critical Points to Address in a Mid-IR Proposal

    0.070 - 0.744 eV 
    (70 - 744 meV = 560 - 6000 cm-1)

  • Far-IR (02B1-1)
    Far Infrared Spectroscopy

    • ATR Infrared Spectroscopy
    • Far-Infrared Microscope
    • Far-Infrared Photoacoustic Spectroscopy
    • Far-Infrared Spectroscopy (Far-IR)
    • High Resolution Infrared Spectroscopy

    Critical Points to Address in a Far IR Proposal

    0.00062 - 0.124 eV (0.62 - 124 meV = 5 - 1000 cm-1)

Beamlines:

Tap the arrow for more information, or the beamline name for all details.

APS – Other Beamlines
Techniques

Beamlines include all XSD beamlines at the APS — please contact the CLS@APS staff for more information

Energy (eV) (cm -1 for IR)

Various

Beamline Contact

Zou Finfrock

BXDS-IVU
Brockhouse X-ray Diffraction and Scattering Beamlines - Undulator Beamline
Techniques
  • Diffraction Anomalous Fine Structure (DAFS)
  • Grazing Incidence X-ray Diffraction (GIXRD)
  • Reciprocal Space Maps
  • Resonant/Anomalous/Magnetic Diffraction
  • Single-Crystals / Thin Films X-ray Diffraction
  • Small & Wide Angle X-ray Scattering (SAXS/WAXS)
  • Small Angle X-ray Reflectivity

 

 

Energy (eV) (cm -1 for IR)

5 – 21 keV

Beamline Contact

Beatriz Moreno

REIXS (10ID-2)
Resonant Elastic and Inelastic X-ray Scattering
Techniques
  • Resonant Inelastic X-ray Scattering (RIXS)
  • Resonant Soft X-Ray Scattering (RSXS)
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
  • X-ray Emission Spectroscopy (XES)
  • X-ray Excited Optical Luminescence (XEOL)
  • X-ray Magnetic Circular Dichroism (XMCD)
  • X-ray Magnetic Linear Dichroism (XMLD)
Energy (eV) (cm -1 for IR)

90 - 2000 eV

Beamline Contact

Teak Boyko

BXDS-WLE
Brockhouse X-ray Diffraction and Scattering Beamlines - Low Energy Wiggler
Techniques
  • Grazing Incidence X-ray Diffraction (GIXRD, GISAXS)
  • High-Resolution X-ray Powder Diffraction
  • In-situ Diffraction with Rapid Thermal Annealing
  • Single Crystal Small Molecule Crystallography
  • Small & Wide Angle X-ray Scattering (SAXS/WAXS)
  • X-ray Reflectivity
Energy (eV) (cm -1 for IR)

7 - 22 keV

Beamline Contact

Beatriz Moreno

VESPERS (07B2-1)
Very Sensitive Elemental and Structural Probe Employing Radiation from a Synchrotron
Techniques
  • Differential Aperture X-ray Microscopy (DAXM)
  • Fluorescence Microscopy
  • Grazing Incidence X-ray Absorption Spectroscopy (GI-XAFS)
  • Grazing Incidence X-ray Diffraction (GIXRD)
  • Micro XAFS/XRD/XRF Imaging
  • White Beam Access
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
  • X-ray Diffraction (XRD)
  • X-ray Excited Optical Luminescence (XEOL)
  • X-ray Fluorescence Spectroscopy (XRF)
  • X-ray Laue Diffraction
Energy (eV) (cm -1 for IR)

6000 – 30000

Beamline Contact

Renfei Feng

CMCF-ID (08ID-1)
Canadian Macromolecular Crystallography Facility
Techniques
  • Macromolecular Crystollography (MX)
  • Single-crystal X-ray Diffraction

Critical Points to Address in a CMCF Proposal

Energy (eV) (cm -1 for IR)

6000 – 18000

Beamline Contact

Michel Fodje

BioXAS-Spectroscopy (07ID-2)
High-Sensitivity X-ray Absorption Spectroscopy
Techniques
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
Energy (eV) (cm -1 for IR)

5000-32000

Beamline Contact

Roman Chernikov

BioXAS-Imaging (07ID-1)
BioXAS-Imaging
Techniques
  • X-ray Absorption Spectroscopy (XAS) in situ
  • X-ray Fluorescence Imaging
Energy (eV) (cm -1 for IR)

5000-21000

Beamline Contact

Gosia Korbas

HXMA (06ID-1)
Hard X-ray MicroAnalysis
Techniques
  • Grazing Incidence X-ray Absorption Spectroscopy (GI-XAFS)
  • High Pressure XANES
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
Energy (eV) (cm -1 for IR)

5000 – 40000

Beamline Contact

Ning Chen

VLS-PGM (11ID-2)
Variable Line Spacing Plane Grating Monochromator
Techniques
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
  • X-ray Excited Optical Luminescence (XEOL)

Critical Points to Address in a VLS-PGM Proposal

Example VLS-PGM Proposal

Energy (eV) (cm -1 for IR)

5.5 – 250

Beamline Contact

Lucia Zuin

CMCF-BM (08B1-1)
Canadian Macromolecular Crystallography Facility
Techniques
  • Macromolecular Crystollography (MX)
  • Powder Diffraction/Scattering
  • Single-crystal X-ray Diffraction
  • XANES on crystals

Critical Points to Address in a CMCF Proposal

Energy (eV) (cm -1 for IR)

4000 - 18000

Beamline Contact

Michel Fodje

APS – Beamline 20-ID-B,C: Sector 20 – Insertion Device
Techniques
  • Confocal X-ray Microscopy
  • Micro XAFS/XRD/XRF Imaging
  • Resonant X-ray Emission Spectroscopy (XES)
  • Time-resolved X-ray Absorption Fine Structure
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Raman Scattering (XRS)
Energy (eV) (cm -1 for IR)

4.3 – 27 keV (Si111) 8 – 50 keV (Si311)

Beamline Contact

Zou Finfrock

BMIT-ID (05ID-2)
Biomedical Imaging and Therapy
Techniques
  • Absorption and propagation based phase-contrast
  • Computed (micro)Tomography (µCT) and radiography including propagation-based phase-contrast
  • Irradiation experiments
  • K-edge Subtraction Imaging (KES)

Critical Points to Address in a BMIT Proposal

Energy (eV) (cm -1 for IR)

30000 - 140000

Beamline Contact

Sergey Gasilov

SGM (11ID-1)
High Resolution Spherical Grating Monochromator
Techniques
  • Auger Electron Spectroscopy (AES)
  • Micro XAFS/XRF Imaging
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Imaging
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
  • X-ray Excited Optical Luminescence (XEOL)
  • X-ray Fluorescence Spectroscopy (XRF)
  • X-ray Photoelectron Spectroscopy (XPS)
Energy (eV) (cm -1 for IR)

240 - 2000

Beamline Contact

Tom Regier

BXDS-WHE
Brockhouse X-ray Diffraction and Scattering Beamlines - High Energy Wiggler
Techniques
  • Anomalous Diffraction
  • Pair Distribution Function (PDF)
  • Powder Diffraction/Scattering
Energy (eV) (cm -1 for IR)

20 – 94keV (0.61 – 0.13 Angstrom)

Beamline Contact

Graham King

APS – Beamline 20-BM-B: Sector 20 – Bending Magnet
Techniques
  • Diffraction Anomalous Fine Structure (DAFS)
  • Microfluorescence (μXRF)
  • Time-resolved X-ray Excited Optical Luminescence (XEOL)
  • X-ray Absorption Fine Structure (XAFS)
Energy (eV) (cm -1 for IR)

2.7 – 32.7 keV

Beamline Contact

Zou Finfrock

SXRMB (06B1-1)
Soft X-ray Microcharacterization Beamline
Techniques
  • Angle-Resolved Photoemission Spectroscopy (ARPES)
  • Micro XAFS/XRD/XRF Imaging
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
  • X-ray Excited Optical Luminescence (XEOL)
  • X-ray Photoelectron Spectroscopy (XPS)
Energy (eV) (cm -1 for IR)

1700 – 10000

Beamline Contact

Mohsen Shakouri

QMSC (09ID-1)
Quantum Materials Spectroscopy Centre
Techniques
  • Angle-Resolved Photoemission Spectroscopy (ARPES)
  • Spin resolved momentum distribution curves
Energy (eV) (cm -1 for IR)

15-1200 eV

Beamline Contact

Sergey Gorovikov

SM (10ID-1)
Soft X-ray Spectromicroscopy
Techniques
  • Cryo-Scanning Transmission X-ray Microscopy (Cryo-STXM)
  • NEXAFS Spectromicroscopy - STXM XRF mode
  • Photoemission Electron Microscopy (PEEM)
  • Scanning Transmission X-ray Microscopy (STXM)
  • Soft X-ray Tomography
  • STXM-Ptychography
  • X-ray Magnetic Circular Dichroism (XMCD)
  • X-ray Magnetic Linear Dichroism (XMLD)

Critical Points to Address in an SM Proposal

Energy (eV) (cm -1 for IR)

130 – 2700

Beamline Contact

Jian Wang

BMIT-BM (05B1-1)
Biomedical Imaging and Therapy
Techniques
  • Absorption and propagation based phase-contrast
  • Analyzer crystal-based imaging (DEI, USAXS)
  • Computed (micro)Tomography (µCT) and radiography including propagation-based phase-contrast
  • K-edge Subtraction Imaging (KES, SKES)
  • Rocking-curve imaging
  • Ultrafast/time-resolved CT and radiography
  • White Beam Access

Critical Points to Address in a BMIT Proposal

Energy (eV) (cm -1 for IR)

12600-40000

Beamline Contact

Sergey Gasilov

SyLMAND (05B2-1)
Synchrotron Laboratory for Micro And Nano Devices
Techniques
  • Deep X-ray lithography
  • LIGA Process
Energy (eV) (cm -1 for IR)

1000 – 15000

Beamline Contact

Garth Wells

Mid-IR (01B1-1)
Mid Infrared Spectromicroscopy
Techniques
  • ATR Infrared Spectroscopy
  • Chemical Infrared Imaging
  • Fourier Transform Infrared Spectroscopy (FTIR)
  • FTIR Spectromicroscopy
  • Techniques Under Development:
    • ATR Infrared Chemical Imaging


Critical Points to Address in a Mid-IR Proposal

Energy (eV) (cm -1 for IR)

0.070 - 0.744 eV 
(70 - 744 meV = 560 - 6000 cm-1)

Beamline Contact

Scott Rosendahl

Far-IR (02B1-1)
Far Infrared Spectroscopy
Techniques
  • ATR Infrared Spectroscopy
  • Far-Infrared Microscope
  • Far-Infrared Photoacoustic Spectroscopy
  • Far-Infrared Spectroscopy (Far-IR)
  • High Resolution Infrared Spectroscopy

Critical Points to Address in a Far IR Proposal

Energy (eV) (cm -1 for IR)

0.00062 - 0.124 eV (0.62 - 124 meV = 5 - 1000 cm-1)

Beamline Contact

Brant Billinghurst

Connect with us

By providing your email address, you are expressing consent to receive electronic messages from the Canadian Light Source. You can unsubscribe from these messages at any time.

Monthly Newsletter

**Newsletters are sent approximately once a month**

Events Notifications

If you’re looking for information on how you can use CLS techniques in your research program, please contact us using this form.

Example queries may include: Feasibility around a potential experiment? A scientific problem we can help you solve? Is your question related to a specific technique? Do you want to know more about how to apply for beamtime?