Search
The Canadian Light Source facility consists of a 2.9 GeV storage ring and a linear accelerator that serves as an injector to the rings. The ring has a circumference of 170.88m, with a maximum current of 220 mA. Its horizontal emittance is 18 nm-rad, with an approximate vertical emittance of .09 nm-rad.
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Beamline
Techniques
Energy (eV) (cm -1 for IR)
Status
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APS – Beamline 20-BM-B: Sector 20 – Bending Magnet
- Diffraction Anomalous Fine Structure (DAFS)
- Microfluorescence (μXRF)
- Time-resolved X-ray Excited Optical Luminescence (XEOL)
- X-ray Absorption Fine Structure (XAFS)
2.7 – 32.7 keV
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APS – Beamline 20-ID-B,C: Sector 20 – Insertion Device
- Confocal X-ray Microscopy
- Micro XAFS/XRD/XRF Imaging
- Resonant X-ray Emission Spectroscopy (XES)
- Time-resolved X-ray Absorption Fine Structure
- X-ray Absorption Fine Structure (XAFS)
- X-ray Raman Scattering (XRS)
4.3 – 27 keV (Si111) 8 – 50 keV (Si311)
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Beamlines include all XSD beamlines at the APS — please contact the CLS@APS staff for more information
Various
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Biological X-ray Absorption Spectroscopy (BioXAS-Spectroscopy)
07ID-2- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
5-32 keV
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Biological X-ray Absorption Spectroscopy (BioXAS Imaging)
07-ID-1-
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Biomedical Imaging and Therapy (BMIT-BM)
05B1-1- Computed Tomography (CT)
- Conventional Absorption Imaging
- Diffraction Enhanced Imaging (DEI)
- In-Line (Propagation-Based) Phase Contrast Imaging (PBI)
- K-edge Subtraction Imaging (KES)
- White Beam Access
12600-40000
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Biomedical Imaging and Therapy (BMIT-ID)
05ID-2- Computed Tomography (voxel size >= 2um^3) (CT)
- Conventional Absorption Imaging
- In-Line (Propagation-Based) Phase Contrast Imaging (PBI)
- K-edge Subtraction Imaging (KES)
- Micro Computed Tomography (voxel size < 1um^3) (uCT)
25000 – 150000
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Brockhouse X-ray Diffraction and Scattering Beamlines (BXDS-IVU)
Undulator Beamline- Anomalous Diffraction
- Grazing Incidence X-ray Diffraction (GIXRD)
- Magnetic Diffraction
- SAXS
- Single-crystal X-ray Diffraction
- Small Angle X-ray Reflectivity
5 – 24 keV
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Brockhouse X-ray Diffraction and Scattering Beamlines (BXDS-WHE)
High Energy Wiggler- Anomalous Diffraction
- Grazing Incidence X-ray Diffraction (GIXRD)
- Magnetic Diffraction
- Single-crystal X-ray Diffraction
- Small Angle X-ray Reflectivity
20 – 94keV (0.61 – 0.13 Angstrom)
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Brockhouse X-ray Diffraction and Scattering Beamlines (BXDS-WLE)
Low Energy Wiggler- High Pressure Powder Diffraction
- Pair Distribution Function (PDF)
- Powder Diffraction/Scattering
- Single crystal X-ray diffraction
- X-ray Diffraction (XRD)
5 - 94 keV
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Canadian Macromolecular Crystallography Facility (CMCF-BM)
08B1-1- Macromolecule Crystollography (MX)
- Powder Diffraction/Scattering
- Single-crystal X-ray Diffraction
- XANES on crystals
4000 - 18000
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Canadian Macromolecular Crystallography Facility (CMCF-ID)
08ID-1- Macromolecule Crystollography (MX)
- Single-crystal X-ray Diffraction
6000 – 18000
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Far Infrared Spectroscopy (Far-IR)
02B1-1- Far-Infrared Microscope
- Far-Infrared Photoacoustic Spectroscopy
- Far-Infrared Spectroscopy (Far-IR)
- High Resolution Infrared Spectroscopy
0.00062 - 0.124 eV (0.62 - 124 meV = 5 - 1000 cm-1)
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Hard X-ray MicroAnalysis (HXMA)
06ID-1- Diffraction Anomalous Fine Structure (DAFS)
- Grazing Incidence Small Angle X-ray Scattering (GISAXS)
- Grazing Incidence X-ray Diffraction (GIXRD)
- High Pressure Powder Diffraction
- Resonant X-ray Diffraction (RXD)
- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
- X-ray Diffraction (XRD)
5000 – 40000
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High Resolution Spherical Grating Monochromator (SGM)
11ID-1- Auger Electron Spectroscopy (AES)
- Micro XAFS/XRF Imaging
- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Imaging
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
- X-ray Excited Optical Luminescence (XEOL)
- X-ray Fluorescence Spectroscopy (XRF)
- X-ray Photoelectron Spectroscopy (XPS)
240 - 2000
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Mid Infrared Spectromicroscopy (Mid-IR)
01B1-1- ATR Infrared Spectroscopy
- Chemical Infrared Imaging
- Fourier Transform Infrared Spectroscopy (FTIR)
- FTIR Spectromicroscopy
- Techniques Under Development:
- ATR Infrared Chemical Imaging
0.070 - 0.744 eV
(70 - 744 meV = 560 - 6000 cm-1) -
Quantum Materials Spectroscopy Centre (QMSC)
- Angle-Resolved Photoemission Spectroscopy (ARPES)
- Spin resolved momentum distribution curves
15-1000 eV
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Resonant Elastic and Inelastic X-ray Scattering (REIXS)
10ID-2- Resonant Inelastic X-ray Scattering (RIXS)
- Resonant Soft X-Ray Scattering (RSXS)
- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
- X-ray Emission Spectroscopy (XES)
- X-ray Magnetic Circular Dichroism (XMCD)
- X-ray Magnetic Linear Dichroism (XMLD)
80 – 2000
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Soft X-ray Microcharacterization Beamline (SXRMB)
06B1-1- Angle-Resolved Photoemission Spectroscopy (ARPES)
- Micro XAFS/XRD/XRF Imaging
- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
- X-ray Excited Optical Luminescence (XEOL)
- X-ray Photoelectron Spectroscopy (XPS)
1700 – 10000
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Soft X-ray Spectromicroscopy (SM)
10ID-1- Cryo-Scanning Transmission X-ray Microscopy (Cryo-STXM)
- NEXAFS Spectromicroscopy - STXM XRF mode
- Photoemission Electron Microscopy (PEEM)
- Scanning Transmission X-ray Microscopy (STXM)
- Soft X-ray Tomography
- STXM-Ptychography
- X-ray Magnetic Circular Dichroism (XMCD)
- X-ray Magnetic Linear Dichroism (XMLD)
130 – 2700
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Synchrotron Laboratory for Micro And Nano Devices (SyLMAND)
05B2-1- Deep X-ray lithography
- LIGA Process
1000 – 15000
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Variable Line Spacing Plane Grating Monochromator (VLS-PGM)
11ID-2- Auger Electron Spectroscopy (AES)
- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
- X-ray Excited Optical Luminescence (XEOL)
- X-ray Photoelectron Spectroscopy (XPS)
5.5 – 250
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Very Sensitive Elemental and Structural Probe Employing Radiation from a Synchrotron (VESPERS)
07B2-1- Differential Aperture X-ray Microscopy (DAXM)
- Fluorescence Microscopy
- Grazing Incidence X-ray Absorption Spectroscopy (GI-XAFS)
- Grazing Incidence X-ray Diffraction (GIXRD)
- Micro XAFS/XRD/XRF Imaging
- White Beam Access
- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
- X-ray Diffraction (XRD)
- X-ray Excited Optical Luminescence (XEOL)
- X-ray Fluorescence Spectroscopy (XRF)
- X-ray Laue Diffraction
6000 – 30000
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