Beamlines

The Canadian Light Source facility consists of a 2.9 GeV storage ring and a linear accelerator that serves as an injector to the rings. The ring has a circumference of 170.88m, with a maximum current of 220 mA. Its horizontal emittance is 18 nm-rad, with an approximate vertical emittance of .09 nm-rad.

Beamlines:

Tap the arrow for more information, or the beamline name for all details.

APS – Beamline 20-BM-B: Sector 20 – Bending Magnet
Techniques
  • Diffraction Anomalous Fine Structure (DAFS)
  • Microfluorescence (μXRF)
  • Time-resolved X-ray Excited Optical Luminescence (XEOL)
  • X-ray Absorption Fine Structure (XAFS)
Energy (eV) (cm -1 for IR)

2.7 – 32.7 keV

Status
APS – Beamline 20-ID-B,C: Sector 20 – Insertion Device
Techniques
  • Confocal X-ray Microscopy
  • Micro XAFS/XRD/XRF Imaging
  • Resonant X-ray Emission Spectroscopy (XES)
  • Time-resolved X-ray Absorption Fine Structure
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Raman Scattering (XRS)
Energy (eV) (cm -1 for IR)

4.3 – 27 keV (Si111) 8 – 50 keV (Si311)

Status
APS – Other Beamlines
Techniques

Beamlines include all XSD beamlines at the APS — please contact the CLS@APS staff for more information

Energy (eV) (cm -1 for IR)

Various

Status
Biological X-ray Absorption Spectroscopy (BioXAS-Spectroscopy)
07ID-2
Techniques
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
Energy (eV) (cm -1 for IR)

5-32 keV

Status
Biomedical Imaging and Therapy (BMIT-BM)
05B1-1
Techniques
  • Computed Tomography (CT)
  • Conventional Absorption Imaging
  • Diffraction Enhanced Imaging (DEI)
  • In-Line (Propagation-Based) Phase Contrast Imaging (PBI)
  • K-edge Subtraction Imaging (KES)
  • White Beam Access
Energy (eV) (cm -1 for IR)

12600-40000

Status
Biomedical Imaging and Therapy (BMIT-ID)
05ID-2
Techniques
  • Computed Tomography (voxel size >= 2um^3) (CT)
  • Conventional Absorption Imaging
  • In-Line (Propagation-Based) Phase Contrast Imaging (PBI)
  • K-edge Subtraction Imaging (KES)
  • Micro Computed Tomography (voxel size < 1um^3) (uCT)

Critical Points to Address in a BMIT proposal

Energy (eV) (cm -1 for IR)

25000 – 150000

Status
Brockhouse X-ray Diffraction and Scattering Beamlines (BXDS-IVU)
Undulator Beamline
Techniques
  • Anomalous Diffraction
  • Grazing Incidence X-ray Diffraction (GIXRD)
  • Magnetic Diffraction
  • SAXS
  • Single-crystal X-ray Diffraction
  • Small Angle X-ray Reflectivity
Energy (eV) (cm -1 for IR)

5 – 24 keV

Status
Brockhouse X-ray Diffraction and Scattering Beamlines (BXDS-WHE)
High Energy Wiggler
Techniques
  • Anomalous Diffraction
  • Grazing Incidence X-ray Diffraction (GIXRD)
  • Magnetic Diffraction
  • Single-crystal X-ray Diffraction
  • Small Angle X-ray Reflectivity
Energy (eV) (cm -1 for IR)

20 – 94keV (0.61 – 0.13 Angstrom)

Status
Brockhouse X-ray Diffraction and Scattering Beamlines (BXDS-WLE)
Low Energy Wiggler
Techniques
  • High Pressure Powder Diffraction
  • Pair Distribution Function (PDF)
  • Powder Diffraction/Scattering
  • Single crystal X-ray diffraction
  • X-ray Diffraction (XRD)
Energy (eV) (cm -1 for IR)

5 - 94 keV

Status
Canadian Macromolecular Crystallography Facility (CMCF-BM)
08B1-1
Techniques
  • Macromolecule Crystollography (MX)
  • Powder Diffraction/Scattering
  • Single-crystal X-ray Diffraction
  • XANES on crystals
Energy (eV) (cm -1 for IR)

4000 - 18000

Status
Canadian Macromolecular Crystallography Facility (CMCF-ID)
08ID-1
Techniques
  • Macromolecule Crystollography (MX)
  • Single-crystal X-ray Diffraction
Energy (eV) (cm -1 for IR)

6000 – 18000

Status
Far Infrared Spectroscopy (Far-IR)
02B1-1
Techniques
  • Far-Infrared Microscope
  • Far-Infrared Photoacoustic Spectroscopy
  • Far-Infrared Spectroscopy (Far-IR)
  • High Resolution Infrared Spectroscopy

Critical Points to Address in a Far IR Proposal

Energy (eV) (cm -1 for IR)

0.00062 - 0.124 eV (0.62 - 124 meV = 5 - 1000 cm-1)

Status
Hard X-ray MicroAnalysis (HXMA)
06ID-1
Techniques
  • Diffraction Anomalous Fine Structure (DAFS)
  • Grazing Incidence Small Angle X-ray Scattering (GISAXS)
  • Grazing Incidence X-ray Diffraction (GIXRD)
  • High Pressure Powder Diffraction
  • Resonant X-ray Diffraction (RXD)
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
  • X-ray Diffraction (XRD)
Energy (eV) (cm -1 for IR)

5000 – 40000

Status
High Resolution Spherical Grating Monochromator (SGM)
11ID-1
Techniques
  • Auger Electron Spectroscopy (AES)
  • Micro XAFS/XRF Imaging
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Imaging
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
  • X-ray Excited Optical Luminescence (XEOL)
  • X-ray Fluorescence Spectroscopy (XRF)
  • X-ray Photoelectron Spectroscopy (XPS)
Energy (eV) (cm -1 for IR)

240 - 2000

Status
Mid Infrared Spectromicroscopy (Mid-IR)
01B1-1
Techniques
  • ATR Infrared Spectroscopy
  • Chemical Infrared Imaging
  • Fourier Transform Infrared Spectroscopy (FTIR)
  • FTIR Spectromicroscopy
  • Techniques Under Development:
    • ATR Infrared Chemical Imaging


Critical Points to Address in a Mid-IR Proposal

Energy (eV) (cm -1 for IR)

0.070 - 0.744 eV 
(70 - 744 meV = 560 - 6000 cm-1)

Status
Quantum Materials Spectroscopy Centre (QMSC)
Techniques
  • Angle-Resolved Photoemission Spectroscopy (ARPES)
  • Spin resolved momentum distribution curves
Energy (eV) (cm -1 for IR)

15-1000 eV

Status
    ---
Resonant Elastic and Inelastic X-ray Scattering (REIXS)
10ID-2
Techniques
  • Resonant Inelastic X-ray Scattering (RIXS)
  • Resonant Soft X-Ray Scattering (RSXS)
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
  • X-ray Emission Spectroscopy (XES)
  • X-ray Magnetic Circular Dichroism (XMCD)
  • X-ray Magnetic Linear Dichroism (XMLD)

Critical Points to Address in a REIXS proposal

Energy (eV) (cm -1 for IR)

80 – 2000

Status
Soft X-ray Microcharacterization Beamline (SXRMB)
06B1-1
Techniques
  • Angle-Resolved Photoemission Spectroscopy (ARPES)
  • Micro XAFS/XRD/XRF Imaging
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
  • X-ray Excited Optical Luminescence (XEOL)
  • X-ray Photoelectron Spectroscopy (XPS)
Energy (eV) (cm -1 for IR)

1700 – 10000

Status
Soft X-ray Spectromicroscopy (SM)
10ID-1
Techniques
  • Cryo-Scanning Transmission X-ray Microscopy (Cryo-STXM)
  • NEXAFS Spectromicroscopy - STXM XRF mode
  • Photoemission Electron Microscopy (PEEM)
  • Scanning Transmission X-ray Microscopy (STXM)
  • Soft X-ray Tomography
  • STXM-Ptychography
  • X-ray Magnetic Circular Dichroism (XMCD)
  • X-ray Magnetic Linear Dichroism (XMLD)

Critical Points to Address in an SM proposal

Energy (eV) (cm -1 for IR)

130 – 2700

Status
Synchrotron Laboratory for Micro And Nano Devices (SyLMAND)
05B2-1
Techniques
  • Deep X-ray lithography
  • LIGA Process
Energy (eV) (cm -1 for IR)

1000 – 15000

Status
Variable Line Spacing Plane Grating Monochromator (VLS-PGM)
11ID-2
Techniques
  • Auger Electron Spectroscopy (AES)
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
  • X-ray Excited Optical Luminescence (XEOL)
  • X-ray Photoelectron Spectroscopy (XPS)

Critical Points to Address in a VLS-PGM proposal

Energy (eV) (cm -1 for IR)

5.5 – 250

Status
Very Sensitive Elemental and Structural Probe Employing Radiation from a Synchrotron (VESPERS)
07B2-1
Techniques
  • Differential Aperture X-ray Microscopy (DAXM)
  • Fluorescence Microscopy
  • Grazing Incidence X-ray Absorption Spectroscopy (GI-XAFS)
  • Grazing Incidence X-ray Diffraction (GIXRD)
  • Micro XAFS/XRD/XRF Imaging
  • White Beam Access
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
  • X-ray Diffraction (XRD)
  • X-ray Excited Optical Luminescence (XEOL)
  • X-ray Fluorescence Spectroscopy (XRF)
  • X-ray Laue Diffraction
Energy (eV) (cm -1 for IR)

6000 – 30000

Status

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