Beamlines
Search
The Canadian Light Source facility consists of a 2.9 GeV storage ring and a linear accelerator that serves as an injector to the rings. The ring has a circumference of 170.88m, with a maximum current of 220 mA. Its horizontal emittance is 18 nm-rad, with an approximate vertical emittance of .09 nm-rad.
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Beamline
Techniques
Energy (eV) (cm -1 for IR)
Status
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APS – Beamline 20-BM-B: Sector 20 – Bending Magnet
- Diffraction Anomalous Fine Structure (DAFS)
- Microfluorescence (μXRF)
- Time-resolved X-ray Excited Optical Luminescence (XEOL)
- X-ray Absorption Fine Structure (XAFS)
2.7 – 32.7 keV
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APS – Beamline 20-ID-B,C: Sector 20 – Insertion Device
- Confocal X-ray Microscopy
- Micro XAFS/XRD/XRF Imaging
- Resonant X-ray Emission Spectroscopy (XES)
- Time-resolved X-ray Absorption Fine Structure
- X-ray Absorption Fine Structure (XAFS)
- X-ray Raman Scattering (XRS)
4.3 – 27 keV (Si111) 8 – 50 keV (Si311)
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Beamlines include all XSD beamlines at the APS — please contact the CLS@APS staff for more information
Various
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BioXAS-Imaging (07ID-1)
BioXAS-Imaging- X-ray Absorption Spectroscopy (XAS) in situ
- X-ray Fluorescence Imaging
5000-21000
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BioXAS-Spectroscopy (07ID-2)
High-Sensitivity X-ray Absorption Spectroscopy- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
5000-32000
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BMIT-BM (05B1-1)
Biomedical Imaging and Therapy- Absorption and propagation based phase-contrast
- Analyzer crystal-based imaging (DEI, USAXS)
- Computed (micro)Tomography (µCT) and radiography including propagation-based phase-contrast
- K-edge Subtraction Imaging (KES, SKES)
- Rocking-curve imaging
- Ultrafast/time-resolved CT and radiography
- White Beam Access
12600-40000
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BMIT-ID (05ID-2)
Biomedical Imaging and Therapy- Absorption and propagation based phase-contrast
- Computed (micro)Tomography (µCT) and radiography including propagation-based phase-contrast
- Irradiation experiments
- K-edge Subtraction Imaging (KES)
30000 - 140000
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BXDS-IVU
Brockhouse X-ray Diffraction and Scattering Beamlines - Undulator Beamline- Diffraction Anomalous Fine Structure (DAFS)
- Grazing Incidence X-ray Diffraction (GIXRD)
- Small & Wide Angle X-ray Scattering (SAXS/WAXS)
- Small Angle X-ray Reflectivity
- Single-Crystals / Thin Films X-ray Diffraction
- Reciprocal Space Maps
- Resonant/Anomalous/Magnetic Diffraction
5 – 21 keV
-
BXDS-WHE
Brockhouse X-ray Diffraction and Scattering Beamlines - High Energy Wiggler- Anomalous Diffraction
- Pair Distribution Function (PDF)
- Powder Diffraction/Scattering
20 – 94keV (0.61 – 0.13 Angstrom)
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BXDS-WLE
Brockhouse X-ray Diffraction and Scattering Beamlines - Low Energy Wiggler- Grazing Incidence X-ray Diffraction (GIXRD, GISAXS)
- High-Resolution X-ray Powder Diffraction
- In-situ Diffraction with Rapid Thermal Annealing
- Single Crystal Small Molecule Crystallography
- Small & Wide Angle X-ray Scattering (SAXS/WAXS)
- X-ray Reflectivity
7 - 22 keV
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CMCF-BM (08B1-1)
Canadian Macromolecular Crystallography Facility- Macromolecule Crystollography (MX)
- Powder Diffraction/Scattering
- Single-crystal X-ray Diffraction
- XANES on crystals
4000 - 18000
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CMCF-ID (08ID-1)
Canadian Macromolecular Crystallography Facility- Macromolecule Crystollography (MX)
- Single-crystal X-ray Diffraction
6000 – 18000
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Far-IR (02B1-1)
Far Infrared Spectroscopy- Far-Infrared Microscope
- Far-Infrared Photoacoustic Spectroscopy
- Far-Infrared Spectroscopy (Far-IR)
- High Resolution Infrared Spectroscopy
- ATR Infrared Spectroscopy
0.00062 - 0.124 eV (0.62 - 124 meV = 5 - 1000 cm-1)
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HXMA (06ID-1)
Hard X-ray MicroAnalysis- Grazing Incidence X-ray Absorption Spectroscopy (GI-XAFS)
- High Pressure XANES
- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
5000 – 40000
-
Mid-IR (01B1-1)
Mid Infrared Spectromicroscopy- ATR Infrared Spectroscopy
- Chemical Infrared Imaging
- Fourier Transform Infrared Spectroscopy (FTIR)
- FTIR Spectromicroscopy
- Techniques Under Development:
- ATR Infrared Chemical Imaging
0.070 - 0.744 eV
(70 - 744 meV = 560 - 6000 cm-1) -
QMSC (09ID-1)
Quantum Materials Spectroscopy Centre- Angle-Resolved Photoemission Spectroscopy (ARPES)
- Spin resolved momentum distribution curves
15-1200 eV
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REIXS (10ID-2)
Resonant Elastic and Inelastic X-ray Scattering- Resonant Inelastic X-ray Scattering (RIXS)
- Resonant Soft X-Ray Scattering (RSXS)
- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
- X-ray Emission Spectroscopy (XES)
- X-ray Excited Optical Luminescence (XEOL)
- X-ray Magnetic Circular Dichroism (XMCD)
- X-ray Magnetic Linear Dichroism (XMLD)
90 - 2000 eV
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SGM (11ID-1)
High Resolution Spherical Grating Monochromator- Auger Electron Spectroscopy (AES)
- Micro XAFS/XRF Imaging
- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Imaging
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
- X-ray Excited Optical Luminescence (XEOL)
- X-ray Fluorescence Spectroscopy (XRF)
- X-ray Photoelectron Spectroscopy (XPS)
240 - 2000
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SM (10ID-1)
Soft X-ray Spectromicroscopy- Cryo-Scanning Transmission X-ray Microscopy (Cryo-STXM)
- NEXAFS Spectromicroscopy - STXM XRF mode
- Photoemission Electron Microscopy (PEEM)
- Scanning Transmission X-ray Microscopy (STXM)
- Soft X-ray Tomography
- STXM-Ptychography
- X-ray Magnetic Circular Dichroism (XMCD)
- X-ray Magnetic Linear Dichroism (XMLD)
130 – 2700
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SXRMB (06B1-1)
Soft X-ray Microcharacterization Beamline- Angle-Resolved Photoemission Spectroscopy (ARPES)
- Micro XAFS/XRD/XRF Imaging
- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
- X-ray Excited Optical Luminescence (XEOL)
- X-ray Photoelectron Spectroscopy (XPS)
1700 – 10000
-
SyLMAND (05B2-1)
Synchrotron Laboratory for Micro And Nano Devices- Deep X-ray lithography
- LIGA Process
1000 – 15000
-
VESPERS (07B2-1)
Very Sensitive Elemental and Structural Probe Employing Radiation from a Synchrotron- Differential Aperture X-ray Microscopy (DAXM)
- Fluorescence Microscopy
- Grazing Incidence X-ray Absorption Spectroscopy (GI-XAFS)
- Grazing Incidence X-ray Diffraction (GIXRD)
- Micro XAFS/XRD/XRF Imaging
- White Beam Access
- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
- X-ray Diffraction (XRD)
- X-ray Excited Optical Luminescence (XEOL)
- X-ray Fluorescence Spectroscopy (XRF)
- X-ray Laue Diffraction
6000 – 30000
-
VLS-PGM (11ID-2)
Variable Line Spacing Plane Grating Monochromator- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
- X-ray Excited Optical Luminescence (XEOL)
5.5 – 250
Beamlines:
Tap the arrow for more information, or the beamline name for all details.
APS – Beamline 20-BM-B: Sector 20 – Bending Magnet
Techniques
- Diffraction Anomalous Fine Structure (DAFS)
- Microfluorescence (μXRF)
- Time-resolved X-ray Excited Optical Luminescence (XEOL)
- X-ray Absorption Fine Structure (XAFS)
Energy (eV) (cm -1 for IR)
2.7 – 32.7 keV
Status
APS – Beamline 20-ID-B,C: Sector 20 – Insertion Device
Techniques
- Confocal X-ray Microscopy
- Micro XAFS/XRD/XRF Imaging
- Resonant X-ray Emission Spectroscopy (XES)
- Time-resolved X-ray Absorption Fine Structure
- X-ray Absorption Fine Structure (XAFS)
- X-ray Raman Scattering (XRS)
Energy (eV) (cm -1 for IR)
4.3 – 27 keV (Si111) 8 – 50 keV (Si311)
Status
APS – Other Beamlines
Techniques
Beamlines include all XSD beamlines at the APS — please contact the CLS@APS staff for more information
Energy (eV) (cm -1 for IR)
Various
Status
BioXAS-Imaging (07ID-1)
BioXAS-Imaging
Techniques
- X-ray Absorption Spectroscopy (XAS) in situ
- X-ray Fluorescence Imaging
Energy (eV) (cm -1 for IR)
5000-21000
Status
BioXAS-Spectroscopy (07ID-2)
High-Sensitivity X-ray Absorption Spectroscopy
Techniques
- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
Energy (eV) (cm -1 for IR)
5000-32000
Status
BMIT-BM (05B1-1)
Biomedical Imaging and Therapy
Techniques
- Absorption and propagation based phase-contrast
- Analyzer crystal-based imaging (DEI, USAXS)
- Computed (micro)Tomography (µCT) and radiography including propagation-based phase-contrast
- K-edge Subtraction Imaging (KES, SKES)
- Rocking-curve imaging
- Ultrafast/time-resolved CT and radiography
- White Beam Access
Critical Points to Address in a BMIT Proposal
Energy (eV) (cm -1 for IR)
12600-40000
Status
BMIT-ID (05ID-2)
Biomedical Imaging and Therapy
Techniques
- Absorption and propagation based phase-contrast
- Computed (micro)Tomography (µCT) and radiography including propagation-based phase-contrast
- Irradiation experiments
- K-edge Subtraction Imaging (KES)
Critical Points to Address in a BMIT Proposal
Energy (eV) (cm -1 for IR)
30000 - 140000
Status
BXDS-IVU
Brockhouse X-ray Diffraction and Scattering Beamlines - Undulator Beamline
Techniques
- Diffraction Anomalous Fine Structure (DAFS)
- Grazing Incidence X-ray Diffraction (GIXRD)
- Small & Wide Angle X-ray Scattering (SAXS/WAXS)
- Small Angle X-ray Reflectivity
- Single-Crystals / Thin Films X-ray Diffraction
- Reciprocal Space Maps
- Resonant/Anomalous/Magnetic Diffraction
Energy (eV) (cm -1 for IR)
5 – 21 keV
Status
BXDS-WHE
Brockhouse X-ray Diffraction and Scattering Beamlines - High Energy Wiggler
Techniques
- Anomalous Diffraction
- Pair Distribution Function (PDF)
- Powder Diffraction/Scattering
Energy (eV) (cm -1 for IR)
20 – 94keV (0.61 – 0.13 Angstrom)
Status
BXDS-WLE
Brockhouse X-ray Diffraction and Scattering Beamlines - Low Energy Wiggler
Techniques
- Grazing Incidence X-ray Diffraction (GIXRD, GISAXS)
- High-Resolution X-ray Powder Diffraction
- In-situ Diffraction with Rapid Thermal Annealing
- Single Crystal Small Molecule Crystallography
- Small & Wide Angle X-ray Scattering (SAXS/WAXS)
- X-ray Reflectivity
Energy (eV) (cm -1 for IR)
7 - 22 keV
Status
CMCF-BM (08B1-1)
Canadian Macromolecular Crystallography Facility
Techniques
- Macromolecule Crystollography (MX)
- Powder Diffraction/Scattering
- Single-crystal X-ray Diffraction
- XANES on crystals
Critical Points to Address in a CMCF Proposal
Energy (eV) (cm -1 for IR)
4000 - 18000
Status
CMCF-ID (08ID-1)
Canadian Macromolecular Crystallography Facility
Techniques
- Macromolecule Crystollography (MX)
- Single-crystal X-ray Diffraction
Critical Points to Address in a CMCF Proposal
Energy (eV) (cm -1 for IR)
6000 – 18000
Status
Far-IR (02B1-1)
Far Infrared Spectroscopy
Techniques
- Far-Infrared Microscope
- Far-Infrared Photoacoustic Spectroscopy
- Far-Infrared Spectroscopy (Far-IR)
- High Resolution Infrared Spectroscopy
- ATR Infrared Spectroscopy
Critical Points to Address in a Far IR Proposal
Energy (eV) (cm -1 for IR)
0.00062 - 0.124 eV (0.62 - 124 meV = 5 - 1000 cm-1)
Status
HXMA (06ID-1)
Hard X-ray MicroAnalysis
Techniques
- Grazing Incidence X-ray Absorption Spectroscopy (GI-XAFS)
- High Pressure XANES
- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
Energy (eV) (cm -1 for IR)
5000 – 40000
Status
Mid-IR (01B1-1)
Mid Infrared Spectromicroscopy
Techniques
- ATR Infrared Spectroscopy
- Chemical Infrared Imaging
- Fourier Transform Infrared Spectroscopy (FTIR)
- FTIR Spectromicroscopy
- Techniques Under Development:
- ATR Infrared Chemical Imaging
Critical Points to Address in a Mid-IR Proposal
Energy (eV) (cm -1 for IR)
0.070 - 0.744 eV
(70 - 744 meV = 560 - 6000 cm-1)
Status
QMSC (09ID-1)
Quantum Materials Spectroscopy Centre
Techniques
- Angle-Resolved Photoemission Spectroscopy (ARPES)
- Spin resolved momentum distribution curves
Energy (eV) (cm -1 for IR)
15-1200 eV
Status
REIXS (10ID-2)
Resonant Elastic and Inelastic X-ray Scattering
Techniques
- Resonant Inelastic X-ray Scattering (RIXS)
- Resonant Soft X-Ray Scattering (RSXS)
- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
- X-ray Emission Spectroscopy (XES)
- X-ray Excited Optical Luminescence (XEOL)
- X-ray Magnetic Circular Dichroism (XMCD)
- X-ray Magnetic Linear Dichroism (XMLD)
Energy (eV) (cm -1 for IR)
90 - 2000 eV
Status
SGM (11ID-1)
High Resolution Spherical Grating Monochromator
Techniques
- Auger Electron Spectroscopy (AES)
- Micro XAFS/XRF Imaging
- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Imaging
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
- X-ray Excited Optical Luminescence (XEOL)
- X-ray Fluorescence Spectroscopy (XRF)
- X-ray Photoelectron Spectroscopy (XPS)
Energy (eV) (cm -1 for IR)
240 - 2000
Status
SM (10ID-1)
Soft X-ray Spectromicroscopy
Techniques
- Cryo-Scanning Transmission X-ray Microscopy (Cryo-STXM)
- NEXAFS Spectromicroscopy - STXM XRF mode
- Photoemission Electron Microscopy (PEEM)
- Scanning Transmission X-ray Microscopy (STXM)
- Soft X-ray Tomography
- STXM-Ptychography
- X-ray Magnetic Circular Dichroism (XMCD)
- X-ray Magnetic Linear Dichroism (XMLD)
Critical Points to Address in an SM Proposal
Energy (eV) (cm -1 for IR)
130 – 2700
Status
SXRMB (06B1-1)
Soft X-ray Microcharacterization Beamline
Techniques
- Angle-Resolved Photoemission Spectroscopy (ARPES)
- Micro XAFS/XRD/XRF Imaging
- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
- X-ray Excited Optical Luminescence (XEOL)
- X-ray Photoelectron Spectroscopy (XPS)
Energy (eV) (cm -1 for IR)
1700 – 10000
Status
SyLMAND (05B2-1)
Synchrotron Laboratory for Micro And Nano Devices
Techniques
- Deep X-ray lithography
- LIGA Process
Energy (eV) (cm -1 for IR)
1000 – 15000
Status
VESPERS (07B2-1)
Very Sensitive Elemental and Structural Probe Employing Radiation from a Synchrotron
Techniques
- Differential Aperture X-ray Microscopy (DAXM)
- Fluorescence Microscopy
- Grazing Incidence X-ray Absorption Spectroscopy (GI-XAFS)
- Grazing Incidence X-ray Diffraction (GIXRD)
- Micro XAFS/XRD/XRF Imaging
- White Beam Access
- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
- X-ray Diffraction (XRD)
- X-ray Excited Optical Luminescence (XEOL)
- X-ray Fluorescence Spectroscopy (XRF)
- X-ray Laue Diffraction
Energy (eV) (cm -1 for IR)
6000 – 30000
Status
VLS-PGM (11ID-2)
Variable Line Spacing Plane Grating Monochromator
Techniques
- X-ray Absorption Fine Structure (XAFS)
- X-ray Absorption Near Edge Structure (XANES)
- X-ray Absorption Spectroscopy (XAS)
- X-ray Excited Optical Luminescence (XEOL)
Critical Points to Address in a VLS-PGM Proposal
Energy (eV) (cm -1 for IR)
5.5 – 250