Beamlines

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The Canadian Light Source facility consists of a 2.9 GeV storage ring and a linear accelerator that serves as an injector to the rings. The ring has a circumference of 170.88m, with a maximum current of 220 mA. Its horizontal emittance is 18 nm-rad, with an approximate vertical emittance of .09 nm-rad.

  • BeamlineDown Arrow

    Techniques

    Energy (eV) (cm -1 for IR) Down Arrow

    Status

  • APS – Beamline 20-BM-B: Sector 20 – Bending Magnet

    • Diffraction Anomalous Fine Structure (DAFS)
    • Microfluorescence (μXRF)
    • Time-resolved X-ray Excited Optical Luminescence (XEOL)
    • X-ray Absorption Fine Structure (XAFS)

    2.7 – 32.7 keV

  • APS – Beamline 20-ID-B,C: Sector 20 – Insertion Device

    • Confocal X-ray Microscopy
    • Micro XAFS/XRD/XRF Imaging
    • Resonant X-ray Emission Spectroscopy (XES)
    • Time-resolved X-ray Absorption Fine Structure
    • X-ray Absorption Fine Structure (XAFS)
    • X-ray Raman Scattering (XRS)

    4.3 – 27 keV (Si111) 8 – 50 keV (Si311)

  • APS – Other Beamlines

    Beamlines include all XSD beamlines at the APS — please contact the CLS@APS staff for more information

    Various

  • BioXAS-Spectroscopy (07ID-2)
    Biological X-ray Absorption Spectroscopy

    • X-ray Absorption Fine Structure (XAFS)
    • X-ray Absorption Near Edge Structure (XANES)
    • X-ray Absorption Spectroscopy (XAS)

    5-32 keV

  • BMIT-BM (05B1-1)
    Biomedical Imaging and Therapy

    • Analyzer crystal-based imaging (DEI, USAXS)
    • Computed (micro)Tomography (µCT) and radiography including propagation-based phase-contrast
    • K-edge Subtraction Imaging (KES)
    • Rocking-curve imaging
    • Ultrafast/time-resolved CT and radiography
    • White Beam Access

    Critical Points to Address in a BMIT proposal

    12600-40000

  • BMIT-ID (05ID-2)
    Biomedical Imaging and Therapy

    • Computed (micro)Tomography (µCT) and radiography including propagation-based phase-contrast
    • Irradiation experiments
    • K-edge Subtraction Imaging (KES)

    Critical Points to Address in a BMIT proposal

    25000 – 150000

  • BXDS-IVU
    Brockhouse X-ray Diffraction and Scattering Beamlines - Undulator Beamline

    • Anomalous Diffraction
    • Grazing Incidence X-ray Diffraction (GIXRD)
    • Magnetic Diffraction
    • SAXS
    • Single-crystal X-ray Diffraction
    • Small Angle X-ray Reflectivity

    5 – 24 keV

  • BXDS-WHE
    Brockhouse X-ray Diffraction and Scattering Beamlines - High Energy Wiggler

    • Anomalous Diffraction
    • Pair Distribution Function (PDF)
    • Powder Diffraction/Scattering

    20 – 94keV (0.61 – 0.13 Angstrom)

  • BXDS-WLE
    Brockhouse X-ray Diffraction and Scattering Beamlines - Low Energy Wiggler

    • Powder Diffraction/Scattering
    • Single crystal X-ray diffraction
    • X-ray Diffraction (XRD)

    7 - 22 keV

  • CMCF-BM (08B1-1)
    Canadian Macromolecular Crystallography Facility

    • Macromolecule Crystollography (MX)
    • Powder Diffraction/Scattering
    • Single-crystal X-ray Diffraction
    • XANES on crystals

    4000 - 18000

  • CMCF-ID (08ID-1)
    Canadian Macromolecular Crystallography Facility

    • Macromolecule Crystollography (MX)
    • Single-crystal X-ray Diffraction

    6000 – 18000

  • Far-IR (02B1-1)
    Far Infrared Spectroscopy

    • Far-Infrared Microscope
    • Far-Infrared Photoacoustic Spectroscopy
    • Far-Infrared Spectroscopy (Far-IR)
    • High Resolution Infrared Spectroscopy

    Critical Points to Address in a Far IR Proposal

    0.00062 - 0.124 eV (0.62 - 124 meV = 5 - 1000 cm-1)

  • HXMA (06ID-1)
    Hard X-ray MicroAnalysis

    • Diffraction Anomalous Fine Structure (DAFS)
    • Grazing Incidence Small Angle X-ray Scattering (GISAXS)
    • Grazing Incidence X-ray Diffraction (GIXRD)
    • High Pressure Powder Diffraction
    • Resonant X-ray Diffraction (RXD)
    • X-ray Absorption Fine Structure (XAFS)
    • X-ray Absorption Near Edge Structure (XANES)
    • X-ray Absorption Spectroscopy (XAS)
    • X-ray Diffraction (XRD)

    5000 – 40000

  • Mid-IR (01B1-1)
    Mid Infrared Spectromicroscopy

    • ATR Infrared Spectroscopy
    • Chemical Infrared Imaging
    • Fourier Transform Infrared Spectroscopy (FTIR)
    • FTIR Spectromicroscopy
    • Techniques Under Development:
      • ATR Infrared Chemical Imaging


    Critical Points to Address in a Mid-IR Proposal

    0.070 - 0.744 eV 
    (70 - 744 meV = 560 - 6000 cm-1)

  • QMSC (09ID-1, 09ID-2)
    Quantum Materials Spectroscopy Centre

    • Angle-Resolved Photoemission Spectroscopy (ARPES)
    • Spin resolved momentum distribution curves

    15-1000 eV

      ---

  • REIXS (10ID-2)
    Resonant Elastic and Inelastic X-ray Scattering

    • Resonant Inelastic X-ray Scattering (RIXS)
    • Resonant Soft X-Ray Scattering (RSXS)
    • X-ray Absorption Fine Structure (XAFS)
    • X-ray Absorption Near Edge Structure (XANES)
    • X-ray Absorption Spectroscopy (XAS)
    • X-ray Emission Spectroscopy (XES)
    • X-ray Magnetic Circular Dichroism (XMCD)
    • X-ray Magnetic Linear Dichroism (XMLD)

    Critical Points to Address in a REIXS proposal

    80 – 2000

  • SGM (11ID-1)
    High Resolution Spherical Grating Monochromator

    • Auger Electron Spectroscopy (AES)
    • Micro XAFS/XRF Imaging
    • X-ray Absorption Fine Structure (XAFS)
    • X-ray Absorption Imaging
    • X-ray Absorption Near Edge Structure (XANES)
    • X-ray Absorption Spectroscopy (XAS)
    • X-ray Excited Optical Luminescence (XEOL)
    • X-ray Fluorescence Spectroscopy (XRF)
    • X-ray Photoelectron Spectroscopy (XPS)

    240 - 2000

  • SM (10ID-1)
    Soft X-ray Spectromicroscopy

    • Cryo-Scanning Transmission X-ray Microscopy (Cryo-STXM)
    • NEXAFS Spectromicroscopy - STXM XRF mode
    • Photoemission Electron Microscopy (PEEM)
    • Scanning Transmission X-ray Microscopy (STXM)
    • Soft X-ray Tomography
    • STXM-Ptychography
    • X-ray Magnetic Circular Dichroism (XMCD)
    • X-ray Magnetic Linear Dichroism (XMLD)

    Critical Points to Address in an SM proposal

    130 – 2700

  • SXRMB (06B1-1)
    Soft X-ray Microcharacterization Beamline

    • Angle-Resolved Photoemission Spectroscopy (ARPES)
    • Micro XAFS/XRD/XRF Imaging
    • X-ray Absorption Fine Structure (XAFS)
    • X-ray Absorption Near Edge Structure (XANES)
    • X-ray Absorption Spectroscopy (XAS)
    • X-ray Excited Optical Luminescence (XEOL)
    • X-ray Photoelectron Spectroscopy (XPS)

    1700 – 10000

  • SyLMAND (05B2-1)
    Synchrotron Laboratory for Micro And Nano Devices

    • Deep X-ray lithography
    • LIGA Process

    1000 – 15000

  • VESPERS (07B2-1)
    Very Sensitive Elemental and Structural Probe Employing Radiation from a Synchrotron

    • Differential Aperture X-ray Microscopy (DAXM)
    • Fluorescence Microscopy
    • Grazing Incidence X-ray Absorption Spectroscopy (GI-XAFS)
    • Grazing Incidence X-ray Diffraction (GIXRD)
    • Micro XAFS/XRD/XRF Imaging
    • White Beam Access
    • X-ray Absorption Fine Structure (XAFS)
    • X-ray Absorption Near Edge Structure (XANES)
    • X-ray Absorption Spectroscopy (XAS)
    • X-ray Diffraction (XRD)
    • X-ray Excited Optical Luminescence (XEOL)
    • X-ray Fluorescence Spectroscopy (XRF)
    • X-ray Laue Diffraction

    6000 – 30000

  • VLS-PGM (11ID-2)
    Variable Line Spacing Plane Grating Monochromator

    • X-ray Absorption Fine Structure (XAFS)
    • X-ray Absorption Near Edge Structure (XANES)
    • X-ray Absorption Spectroscopy (XAS)
    • X-ray Excited Optical Luminescence (XEOL)

    Critical Points to Address in a VLS-PGM proposal

    5.5 – 250

Beamlines:

Tap the arrow for more information, or the beamline name for all details.

APS – Beamline 20-BM-B: Sector 20 – Bending Magnet
Techniques
  • Diffraction Anomalous Fine Structure (DAFS)
  • Microfluorescence (μXRF)
  • Time-resolved X-ray Excited Optical Luminescence (XEOL)
  • X-ray Absorption Fine Structure (XAFS)
Energy (eV) (cm -1 for IR)

2.7 – 32.7 keV

Status
APS – Beamline 20-ID-B,C: Sector 20 – Insertion Device
Techniques
  • Confocal X-ray Microscopy
  • Micro XAFS/XRD/XRF Imaging
  • Resonant X-ray Emission Spectroscopy (XES)
  • Time-resolved X-ray Absorption Fine Structure
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Raman Scattering (XRS)
Energy (eV) (cm -1 for IR)

4.3 – 27 keV (Si111) 8 – 50 keV (Si311)

Status
APS – Other Beamlines
Techniques

Beamlines include all XSD beamlines at the APS — please contact the CLS@APS staff for more information

Energy (eV) (cm -1 for IR)

Various

Status
BioXAS-Spectroscopy (07ID-2)
Biological X-ray Absorption Spectroscopy
Techniques
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
Energy (eV) (cm -1 for IR)

5-32 keV

Status
BMIT-BM (05B1-1)
Biomedical Imaging and Therapy
Techniques
  • Analyzer crystal-based imaging (DEI, USAXS)
  • Computed (micro)Tomography (µCT) and radiography including propagation-based phase-contrast
  • K-edge Subtraction Imaging (KES)
  • Rocking-curve imaging
  • Ultrafast/time-resolved CT and radiography
  • White Beam Access

Critical Points to Address in a BMIT proposal

Energy (eV) (cm -1 for IR)

12600-40000

Status
BMIT-ID (05ID-2)
Biomedical Imaging and Therapy
Techniques
  • Computed (micro)Tomography (µCT) and radiography including propagation-based phase-contrast
  • Irradiation experiments
  • K-edge Subtraction Imaging (KES)

Critical Points to Address in a BMIT proposal

Energy (eV) (cm -1 for IR)

25000 – 150000

Status
BXDS-IVU
Brockhouse X-ray Diffraction and Scattering Beamlines - Undulator Beamline
Techniques
  • Anomalous Diffraction
  • Grazing Incidence X-ray Diffraction (GIXRD)
  • Magnetic Diffraction
  • SAXS
  • Single-crystal X-ray Diffraction
  • Small Angle X-ray Reflectivity
Energy (eV) (cm -1 for IR)

5 – 24 keV

Status
BXDS-WHE
Brockhouse X-ray Diffraction and Scattering Beamlines - High Energy Wiggler
Techniques
  • Anomalous Diffraction
  • Pair Distribution Function (PDF)
  • Powder Diffraction/Scattering
Energy (eV) (cm -1 for IR)

20 – 94keV (0.61 – 0.13 Angstrom)

Status
BXDS-WLE
Brockhouse X-ray Diffraction and Scattering Beamlines - Low Energy Wiggler
Techniques
  • Powder Diffraction/Scattering
  • Single crystal X-ray diffraction
  • X-ray Diffraction (XRD)
Energy (eV) (cm -1 for IR)

7 - 22 keV

Status
CMCF-BM (08B1-1)
Canadian Macromolecular Crystallography Facility
Techniques
  • Macromolecule Crystollography (MX)
  • Powder Diffraction/Scattering
  • Single-crystal X-ray Diffraction
  • XANES on crystals
Energy (eV) (cm -1 for IR)

4000 - 18000

Status
CMCF-ID (08ID-1)
Canadian Macromolecular Crystallography Facility
Techniques
  • Macromolecule Crystollography (MX)
  • Single-crystal X-ray Diffraction
Energy (eV) (cm -1 for IR)

6000 – 18000

Status
Far-IR (02B1-1)
Far Infrared Spectroscopy
Techniques
  • Far-Infrared Microscope
  • Far-Infrared Photoacoustic Spectroscopy
  • Far-Infrared Spectroscopy (Far-IR)
  • High Resolution Infrared Spectroscopy

Critical Points to Address in a Far IR Proposal

Energy (eV) (cm -1 for IR)

0.00062 - 0.124 eV (0.62 - 124 meV = 5 - 1000 cm-1)

Status
HXMA (06ID-1)
Hard X-ray MicroAnalysis
Techniques
  • Diffraction Anomalous Fine Structure (DAFS)
  • Grazing Incidence Small Angle X-ray Scattering (GISAXS)
  • Grazing Incidence X-ray Diffraction (GIXRD)
  • High Pressure Powder Diffraction
  • Resonant X-ray Diffraction (RXD)
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
  • X-ray Diffraction (XRD)
Energy (eV) (cm -1 for IR)

5000 – 40000

Status
Mid-IR (01B1-1)
Mid Infrared Spectromicroscopy
Techniques
  • ATR Infrared Spectroscopy
  • Chemical Infrared Imaging
  • Fourier Transform Infrared Spectroscopy (FTIR)
  • FTIR Spectromicroscopy
  • Techniques Under Development:
    • ATR Infrared Chemical Imaging


Critical Points to Address in a Mid-IR Proposal

Energy (eV) (cm -1 for IR)

0.070 - 0.744 eV 
(70 - 744 meV = 560 - 6000 cm-1)

Status
QMSC (09ID-1, 09ID-2)
Quantum Materials Spectroscopy Centre
Techniques
  • Angle-Resolved Photoemission Spectroscopy (ARPES)
  • Spin resolved momentum distribution curves
Energy (eV) (cm -1 for IR)

15-1000 eV

Status
    ---
REIXS (10ID-2)
Resonant Elastic and Inelastic X-ray Scattering
Techniques
  • Resonant Inelastic X-ray Scattering (RIXS)
  • Resonant Soft X-Ray Scattering (RSXS)
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
  • X-ray Emission Spectroscopy (XES)
  • X-ray Magnetic Circular Dichroism (XMCD)
  • X-ray Magnetic Linear Dichroism (XMLD)

Critical Points to Address in a REIXS proposal

Energy (eV) (cm -1 for IR)

80 – 2000

Status
SGM (11ID-1)
High Resolution Spherical Grating Monochromator
Techniques
  • Auger Electron Spectroscopy (AES)
  • Micro XAFS/XRF Imaging
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Imaging
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
  • X-ray Excited Optical Luminescence (XEOL)
  • X-ray Fluorescence Spectroscopy (XRF)
  • X-ray Photoelectron Spectroscopy (XPS)
Energy (eV) (cm -1 for IR)

240 - 2000

Status
SM (10ID-1)
Soft X-ray Spectromicroscopy
Techniques
  • Cryo-Scanning Transmission X-ray Microscopy (Cryo-STXM)
  • NEXAFS Spectromicroscopy - STXM XRF mode
  • Photoemission Electron Microscopy (PEEM)
  • Scanning Transmission X-ray Microscopy (STXM)
  • Soft X-ray Tomography
  • STXM-Ptychography
  • X-ray Magnetic Circular Dichroism (XMCD)
  • X-ray Magnetic Linear Dichroism (XMLD)

Critical Points to Address in an SM proposal

Energy (eV) (cm -1 for IR)

130 – 2700

Status
SXRMB (06B1-1)
Soft X-ray Microcharacterization Beamline
Techniques
  • Angle-Resolved Photoemission Spectroscopy (ARPES)
  • Micro XAFS/XRD/XRF Imaging
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
  • X-ray Excited Optical Luminescence (XEOL)
  • X-ray Photoelectron Spectroscopy (XPS)
Energy (eV) (cm -1 for IR)

1700 – 10000

Status
SyLMAND (05B2-1)
Synchrotron Laboratory for Micro And Nano Devices
Techniques
  • Deep X-ray lithography
  • LIGA Process
Energy (eV) (cm -1 for IR)

1000 – 15000

Status
VESPERS (07B2-1)
Very Sensitive Elemental and Structural Probe Employing Radiation from a Synchrotron
Techniques
  • Differential Aperture X-ray Microscopy (DAXM)
  • Fluorescence Microscopy
  • Grazing Incidence X-ray Absorption Spectroscopy (GI-XAFS)
  • Grazing Incidence X-ray Diffraction (GIXRD)
  • Micro XAFS/XRD/XRF Imaging
  • White Beam Access
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
  • X-ray Diffraction (XRD)
  • X-ray Excited Optical Luminescence (XEOL)
  • X-ray Fluorescence Spectroscopy (XRF)
  • X-ray Laue Diffraction
Energy (eV) (cm -1 for IR)

6000 – 30000

Status
VLS-PGM (11ID-2)
Variable Line Spacing Plane Grating Monochromator
Techniques
  • X-ray Absorption Fine Structure (XAFS)
  • X-ray Absorption Near Edge Structure (XANES)
  • X-ray Absorption Spectroscopy (XAS)
  • X-ray Excited Optical Luminescence (XEOL)

Critical Points to Address in a VLS-PGM proposal

Energy (eV) (cm -1 for IR)

5.5 – 250

Status

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