Beamline Status Update |
January 30, 2012 |
Accepting General User Proposals
Canadian Light Source (CLS)
- 01B1-1 (Mid IR) - Ferenc Borondics 306-657-3763
- 02B1-1 (Far IR) - Brant Billinghurst 306-657-3554
- 05B1-1 (BMIT, BM) - Tomasz W. Wysokinski 306-657-3710
- 06B1-1 (SXRMB) - Yongfeng Hu 306-657-3722
- 06ID-1 (HXMA)
- Ning Chen 306-657-3571 (XAFS)
- Chang-Yong Kim 306-657-3765 (Microprobe, Powder Diffraction and X-ray Scattering)
- 07B2-1 (VESPERS) - Renfei Feng 306-657-3581
- CMCF Canadian Macromolecular Crystallography Facility
- 08ID-1 (CMCF-ID) - Pawel Grochulski 306-657-3538
- 08B1-1 (CMCF-BM) - Michel Fodje 306-657-3758
- 10ID-1 (SM) - Chithra Karunakaran 306-657-3749
- 10ID-2 (REIXS) - Feizhou He 306-657-3726
- 11ID-1 (SGM) - Tom Regier 306-657-3733
- 11ID-2 (PGM) - Lucia Zuin 306-657-3724
Advanced Photon Source (APS)
- Sector 20/PNC – 20-ID-B,C & 20-BM,B – Robert Gordon 630-252-0581
- Other APS XSD Beamlines - Robert Gordon 630-252-0581
Accepting Letters of Intent during Commissioning
- 05B2-1 (SyLMAND) - Garth Wells (306) 657-3736
- 05ID-2 (BMIT, ID-SOE) - Tomasz W. Wysokinski (306) 657-3710
01B1-1 (Mid IR) Mid IR Spectromicroscopy Beamline:
Status: Operational, accepting proposals.
The beamline is currently accepting user applications for spectromicroscopy and PAS experiments, while commissioning other techniques and capabilities, such as grazing angle spectromicroscopy and ATR spectromicroscopy.
Mid-IR Endstations and capabilities:
- Bruker Vertex 70v/S spectrometer with a Hyperion 3000 microscope and a 64x64 Focal Plane Array detector
- Spectromicroscopy at diffraction-limited spatial resolution both single point and FPA (under commissioning) detectors.
- Available spectral range for spectromicroscopy: Mid-IR to Near IR (500 - 13000 cm-1)
- Photoacoustic Spectroscopy (PAS)
- Step/Scan time resolved measurements
- Sample cooling/heating stage for microscopy in transmission and reflection
- Bruker 66v/S spectrometer with a Hyperion 2000 microscope, offline system
- Spectromicroscopy with Globar source.
- Available spectral ranges for microscopy: Mid-IR (450 - 6000 cm-1)
- Available spectral ranges for spectroscopy: Far-IR to Mid-IR (50 - 6000 cm-1)
- Step/Scan time resolved measurements.
- Bruker Vector 22 Near IR spectrometer, offline system
- ATR spectroscopy and spectromicroscopy (single bounce accessories)
- Grazing incidence spectromicroscopy
- Photoacoustic Spectroscopy (PAS)
Please discuss details of your experiment(s) with Ferenc Borondics, 306-657-3763.
Beamline specifications can be viewed at http://www.lightsource.ca/experimental/midir.php
02B1-1 (Far IR) High Resolution Far Infrared Spectroscopy Beamline:
Status: Operational, accepting proposals.- 94% of Shifts available for Distribution due to beamline technical upgrades.
The Far-IR Beamline is accepting proposals for high resolution studies in the spectral region between ~120 - 1000 cm-1. Furthermore, there are Coherent Synchrotron Radiation (CSR) shifts available for user proposals. These shifts provide very high intensity in the 10-35 cm-1. CSR is still in the testing phase and therefore performance may fluctuate.
Far-IR Endstations and capabilities:
- The Far-IR endstation centers around a Bruker IFS125HR Ultra-high spectral resolution (= 0.00096 cm-1) Fourier transform spectrometer with a maximum optical path difference of 9.4 m. The present set of optical components and detectors cover the spectral region between 10 and 12000 cm-1.
High resolution absorption spectroscopy of gas-phase molecules (10 - 4000 cm-1)- a 0.30 m room temperature multi-reflection cell yielding absorption paths ranging from 1.2 to 12 m to study stable gases that are weak absorbers or possess low-amplitude modes of vibration
- a 2.00 m coolable (down to 150 K) multi-reflection cell for absorption paths ranging from 8 to 100 m to study stable gases that are also weak absorbers or possess low-amplitude modes of vibration
Please discuss details of your experiment(s) with Brant Billinghurst, 306-657-3554.
Beamline specifications can be viewed at High Resolution Far Infrared Spectroscopy (Far IR)
05B1-1 (BMIT, BM) Biomedical Imaging and Therapy
Status: Operational.
The beamline is currently accepting user applications for imaging, therapy and other experiments.
There are 87% of shifts available for distribution due to construction activities.
BMIT BM Endstation capabilities:
- Energy range 15-40 keV
- Sample (including holder) weight up to 50 kg
- Sample thickness up to 150 mm
- Several detectors available with effective resolution from 10 Um to 300 Um
- Max. Beam size at sample point 240 (H) mm x 7 (V) mm
- Max exposed area at sample point: 230 (H) mm x 150 (V) mm.
- Sample preparation lab 1113 available with biosafety cabinet.
- Delivers dose rate of ~4 Gy/min @ 250 mA around 50 keV peak using pink beam
Please discuss details of your experiment(s) with Tomasz Wysokinski, 306-657-3710.
Beamline specifications can be viewed at Biomedical Imaging and Therapy (BMIT-BM)
05B2-1 (SyLMAND) Synchrotron Laboratory for Micro and Nano Devices
Status: The SyLMAND facility (beamline and supporting cleanroom laboratories) is currently accepting proposals for high aspect ratio polymer microstructure fabrication using X-ray lithography.
Polymer microfabrication capabilities (currently offered):
- Polymer: Poly methyl methacrylate (PMMA) (Molecular weight = 1.6M )
- Minimum Feature size: > 10 µm with aspect ratios of up to 50:1
- Polymer thickness: 100 µm to 1 mm
- X-ray Mask: Graphite mask (mask to be bought separately)
Note: Possibility to combine similar aspect ratio layouts onto a mask to reduce cost. Please discuss with Beamline Scientist to explore this possibility. - Standard mask layout area: 75 mm x 75 mm with Graphite mask
- Cleanroom capabilities:
- Titanium seed layer application on substrate by sputtering
- PMMA application and customization of thickness
- Post-exposure development
- Inspection and imaging capabilities (optical and scanning electron microscopes with measurement tools)
- Metrology (Surface profiling and Z-tip)
For additional information on capabilities and to discuss your requirements, please contact Garth Wells at (306) 657-3736
05ID-2 (BMIT, ID-SOE-1) Biomedical Imaging and Therapy
Status: Early stage of commissioning accepting LOI.
The beamline is currently accepting user applications for imaging, therapy and other experiments for experiments in SOE-1 hutch.
BMIT ID-SOE-1 Endstation capabilities:
- Approx. Energy range 20-100 keV
- Sample (including holder) weight up to 120 kg
- Several detectors available with effective resolution from 4 Um to 300 Um
- Max. Beam size at sample point 224 (H) mm x 11 (V) mm
- Sample preparation lab 1113 available with biosafety cabinet.
Please discuss details of your experiment(s) with Tomasz Wysokinski, 306-657-3710.
Beamline specifications can be viewed at Biomedical Imaging and Therapy (BMIT-ID)
06B1-1 (SXRMB) Soft X-ray Microcharacterization Beamline
Status: The X-ray absorption spectroscopy (XAS) endstation is accepting proposals for energies between 1.7-10 KeV. The hard X-ray photoemission is ready to accept Special Request proposals. Please contact the beamline staff for the status and capabilities of this station. The microprobe is being commissioned and will be available in the near future.
There are 70% of shifts available for distribution due to beamline commissioning activities.
SXRMB XAS Endstation capabilities:
- Total electron yield (sample drain current measurement)
- Total fluorescence yield (micro-channel-plate detector, in vacuum)
- Si(Li) drift solid state fluorescence measurement
- Transmission yield
- X-ray Excited Optical Luminescence (XEOL)
- Multiple samples can be run both under vacuum and in inert gas filled configurations
Beamline specifications can be viewed at http://www.lightsource.ca/experimental/sxrmb.php or contact Yongfeng Hu, 306-657-3722.
06ID-1 (HXMA) Hard X-ray micro-Analysis Beamline:
Submit Proposal - XAFS, Powder Diffraction, X-ray Scattering and Microprobe
Status: Operational, accepting proposals
HXMA beamline accepts proposals for four endstations (XAFS, microprobe, powder diffraction and X-ray scattering experiments) for the upcoming cycle. For XAFS, in addition to the standard ionization chamber detectors, a single element Vortex silicon drift detector and a 30 element Ge detector are available. In the microprobe station, microbeam imaging and XANES experiments can be performed with beam spot of approximately 6 micron-vertical x 6 micron-horizontal. Proposal for the X-ray diffraction capabilities with 8-circle psi diffractometer and power diffraction with MAR345 image plate are being accepted. Only single experiment proposals will be considered at this time. The users are encouraged to contact the responsible beamline scientist Dr. N. Chen (ning.chen@lightsource.ca) for XAFS capabilities and Dr. C.-Y. Kim (chang-yong.kim@lightsource.ca) for microprobe, powder diffraction and X-ray scattering capabilities for updated endstation status.
HXMA Endstations and capabilities:
- X-ray Absorption Fine Structure (XAFS): standard transmission and fluorescence ionization chamber detectors; 30 element Ge detector; cryostats for variable temperature sample environment (10 K - 300 K).
- Microprobe: 6 x 6 micron2 for imaging and micro-XANES, heating-cooling stage (-196 - 350 C).
- Powder diffraction: high pressure and ambient condition powder diffraction with MAR345 image plate area detector;
- X-ray scattering: Huber psi-8 diffractometer; closed cycle cryostat (10 K - 450 K); Be-dome (UHV - ambient pressure, 300 K - 800 K.
Please discuss details of your experiment(s) with Ning Chen, 306-657-3571 (XAFS capabilities) and Chang-Yong Kim, 306-657-3765 (Microprobe, Powder Diffraction and X-ray Scattering).
Beamline specifications can be viewed at http://www.lightsource.ca/experimental/hxma.php
07B2-1 (VESPERS) Very Sensitive Elemental and Structural Probe Employing Radiation from a Synchrotron
Status: Operational, accepting proposals
The beamline is currently accepting proposals for micro-diffraction and micro-fluorescence experiments for the coming cycle. XANES (X-ray absorption near edge structure) and Differential aperture X-ray microscopy will also be available. The beamline is capable to provide the beam with different bandwidths of 0.01%, 2%, 10%, in addition to the pink beam.
VESPERS Endstation capabilities:
- Energy range: 6-30 keV
- X-ray microprobe: beam size 2-4 micron
- X-ray Laue diffraction and mapping(CCD Detector)
- X-ray diffraction with transmission geometry (CCD Detector)
- X-ray fluorescence spectroscopy and mapping (Vortex Silicon Drift Detector)
- X-ray absorption near edge structure (fluorescence and transmission modes)
- Differential aperture X-ray microscopy
- Multi-bandpass and pink beam capability
Beamline specifications can be viewed at http://www.lightsource.ca/experimental/vespers.php or contact Renfei Feng, 306-657-3581.
CMCF Canadian Macromolecular Crystallography Facility - consists of two beamlines: 08ID-1 and 08B1-1
08ID-1 (CMCF-ID)
Status: Full MAD capability has been implemented. The beamline is equipped with the SSRL style SAM robot using universal pucks and SSRL cassettes. The SAM robot is being commissioned.
Beamline capacity: The beamline is illuminated by a small-gap in-vacuum undulator (SGU) located in the upstream half of the straight section and chicaned inboard by 0.75 mrad. The overall design of the beamline contains white beam slits (WBS), indirectly cryo-cooled first crystal of the double crystal monochromator (DCM) and sagitally focusing second crystal, and vertically focusing mirror (VFM).
Endstation capabilities:
- Sample to detector range 0.1 m to 0.9 m and 2θ offset
- Energy range 6.2 to 18 keV (2 Å to 0.69 Å)
- Beam size at the sample typically 100 µm pinhole
- Flux >1012 ph/s at 12 keV\
- Typical exposure time 1s
- Semi-automatic centering of the crystals
- The endstation is equipped with Rayonix MX300 CCD X-ray detector
- A Röntek Spectrometer System XFLASH 101A is used to perform the X-ray spectroscopy for MAD and X-ray absorption near edge structure (XANES) on the same crystals, and X-ray fluorescence (XRF) for metal identification in protein derivative crystals.
- Beamline software: MxDC
- Data processing software; AutoProcess (XDS, Pointless, BEST), HKL2000 and MOSFLM
Beamline specifications can be viewed at http://cmcf.lightsource.ca/beamlines/08id-1/ or contact Pawel Grochulski, 306-657-3538
08B1-1 (CMCF-BM)
Status: Full MAD capability has been implemented. The beamline is equipped with the SSRL style SAM robot using universal pucks and SSRL cassettes. Remote access and full automation have been implemented.
Beamline capacity: The beamline is illuminated by bending magnet. The overall design of the beamline contains white beam slits (WBS), vertically collimating mirror (VCM), indirectly water-cooled first crystal of the double crystal monochromator (DCM) and a long second crystal, and toroidal focusing mirror (TFM).
Endstation capabilities:
- Sample to detector range 0.1 m to 0.7 m and 2θ offset
- Energy range 4.0 to18 keV (3.1 Å to 0.69 Å)
- Beam size at sample 200 μm pinhole
- Flux >1011 ph/s at 12 keV
- Typical exposure time 8s
- Semi-automatic centering of the crystals
- The endstation is equipped with Rayonix MX300 HE CCD X-ray detector
- MD2 microdiffractometer
- miniKappa goniometer
- A Bruker Spectrometer System XFLASH 410 is used to perform the X-ray spectroscopy for MAD and X-ray absorption near edge structure (XANES) on the same crystals, and X-ray fluorescence (XRF) for metal identification in protein derivative crystals.
- EXAFS experiments using four element VORTEX detector
- Beamline software: MxDC
- Data processing software; Autoprocess (XDS, Pointless, BEST), HKL2000 and MOSFLM
Beamline specifications can be viewed at http://cmcf.lightsource.ca/beamlines/08b1-1/ or contact Michel Fodje, 306-657-3538
10ID-1 (SM) Soft X-ray Spectromicroscopy Beamline:
Status: The SM beamline is fully operational and covers the photon energy range from 130 eV to 2500 eV. SM is accepting proposals for STXM and X-PEEM experiments.
SM Endstations and capabilities The soft X-ray spectromicroscopy (SM) facility has two endstations, a scanning transmission X-ray microscope (STXM) and a X-ray photoemission electron microscope (X-PEEM). The STXM is permanently installed on the outboard branch line while the X-PEEM is normally mounted on the inboard branch of SM but it can be moved to other CLS beamlines. Both STXM and X-PEEM can be used to measure orientation properties using the capability of the elliptically polarized undulator (EPU) to rotate the direction of the linear polarization vector by 180°. The beamline also provides fully circular (130 - 1000 eV) and elliptically (100 - 2500 eV) polarized light for static and dynamic magnetism measurements via XMCD.
- STXM provides high quality imaging and spatially resolved spectroscopy from 130 to over 2500 eV with sub 30 nm spatial resolution (20 nm outmost-zone zone plate is available). Wet and dry samples have been measured. Devices for in situ azimuthal and polar sample rotation, imposing magnetic fields up to 5 kG at the center of a dipole permanent magnet (~3 kG at the edge), and measuring samples under controlled humidity conditions are available.
For details on performance and capabilities of the STXM, please contact Chithra Karunakarn (chithra.karunkaran@lightsource.ca). - X-PEEM is a commercial X-ray photoemission electron microscope capable of better than 50 nm spatial resolution on appropriate samples. In the fall of 2009 its energy analyzer was removed to provide a period of time without the analyzer, a X-ray absorption mode configuration which provides higher sensitivity, but somewhat larger sampling depth. The X-PEEM chamber is attached to a UHV preparation chamber which includes several evaporation ports, a quartz crystal micro balance, ion sputtering and a LEED/Auger system X-PEEM is accepting proposals on the SM and PGM beamlines. The PEEM will normally be scheduled on the PGM in one block per year, as demand warrants.
For details on performance and capabilities of X-PEEM and to co-ordinate applications on PGM and SM, please contact Jian Wang (jian.wang@lightsource.ca) or Chithra Karunakaran (chithra.karunakaran@lightsource.ca) - Optical microscopy. An Olympus BX51 optical microscope (with 5x, 10x, 20x, 50x, and 100x objectives, phase, dark field) is available to preview samples for STXM or X-PEEM. It is equipped with hardware and software to measure and record sample positioning to assist rapid sample navigation in STXM.
Beamline specifications can be viewed at http://exshare.lightsource.ca/sm or contact Chithra Karunakaran, 306-657-3749
10ID-2 Resonant Elastic and Inelastic Soft X-ray Scattering (REIXS):
Submit General User Proposals for RSXS Endstation
Status: Resonant Soft X-ray Scattering (RSXS) endstation is operational.
X-ray Emission spectroscopy (XES) endstation is under commissioning.
The Omicron Surface Science Systems facility is operational.
Beamline capabilities:
- The energy range is 100 eV to 2000 eV.
- The energy resolution of the REIXS beamline meets or exceeds design values (E/ΔE>5000).
- Photon Polarization: circular left, circular right, linear in arbitrary inclination
RSXS Endstation
- (Resonant) Soft X-ray Scattering (RSXS) / X-Ray Reflectometry
10-motion UHV diffractometer (4-circle diffractometer + x,y,z and detector motions)
Detectors: Channeltron, Photodiode, with multiple slits and filters, Micro-Channel Plate, Polarization Analyzer
Multi-channel Scaler, Electrometer
Sample environment: P ~ 5x10-10 Torr, closed-cycle cryostat for variable sample temperature environment (18 K - 400 K), permanent magnet sample holder, load-lock with crystal-cleaver/scraper
- X-ray Absorption Spectroscopy (XAS)
by total electron yield (TEY), total fluorescence yield (TFY)
- Magnetic Circular Dichroism (MCD)
full polarization control of the incoming beam.
Multiprobe Surface Science Systems by Omicron
This facility is a stand-alone sample characterization system, with the following capabilities:
- X-ray Photoelectron Spectroscopy (XPS) and Imaging XPS (IXPS)
- Ultraviolet Photoelectron Spectroscopy (UPS)
- Auger Electron Spectroscopy (AES)
- Electron Energy Loss Spectroscopy (EELS)
- Secondary Electron Detection (SED) Imaging
- Scanning Tunneling Microscope (STM), UHV
- Atomic Force Microscope (AFM), UHV
Following sources and detectors are available:
- Analyzer: Omicron SPHERA Energy Analyzer, 0 - 2000 eV, energy resolution 10meV
- Omicron Secondary Electron Detection (SED)System
- X-ray Source: Omicron DAR 400 X-ray Source, Mg / Al anode, 15kV, 20mA emission current
- X-ray Source: Omicron XM1000 Monochromated X-ray Source, Al anode, 15kV, 20mA emission current, energy line width 0.25eV.
- UV Source: HIS 13 High Intensity VUV source, for Helium, Neon, Argon, Krypton, Xenon and Hydrogen, discharge current 300 mA.
- Electron Gun Omicron EKF 1000 Electron Source, 100 - 5000 eV, maximum 10µA, LaB6 filament, spot size 1µm
- Electron Gun for EELS: Kimball Physics ELG-2A, 5 – 2000 eV, 1nA to 10µA, Barium Oxide Cathode, with X/Y deflection
- Flood gun: SPEC FG 15/40
- Omicron VT AFM XA Scanning Probe Microscope
Users with allocated beam time have priority to access this facility. The request to use this system alone should be directed to the Beamline Scientist.
Please discuss details of your experiment(s) with Feizhou He, 306-657-3726.
Beamline specifications can be viewed at http://www.lightsource.ca/experimental/reixs.php.
11ID-1 (SGM) High Resolution Spherical Grating Monochromator Beamline:
Status: Operational, accepting proposals
The SGM beamline resolution has been found to meet or exceed design values, and is fully competitive with soft X-ray beamlines worldwide. The sensitivity of XANES to trace elements is of the order of 1% even at the lowest flux range of the beamline. The lowest possible energy is 250 eV, and the highest design energy 2000 eV, although P K- edge XAS is also possible.
The photoemission chamber is now fully commissioned, and several other endstations are available:
SGM Endstations and capabilities:
- X-ray Absorption Spectroscopy (XAS) - The solid sample analysis endstation is now fully operational, with both Total Electron and Fluorescence Yield detectors. The transfer system allows users to exchange samples in under fifteen minutes and multiple samples can be mounted on a single sample holder to improve throughput. At present only room temperature experiments are possible, and this is not expected to change before Dec 2007.
- X-ray Excited Optical Luminescence (XEOL) - XEOL can be performed using an in-vacuum lens in the solid state chamber, or using a video system on either the solid state chamber or the Scienta chamber. The system is fully integrated into the beamline software, allowing optical yield XAS as well as acquisition of individual optical spectra.
- Gas Phase Photoionization Spectroscopy -An aluminum windowed gas cell is attached to the front of the solid sample analysis endstation so that gas phase photoionization spectroscopy can be performed without the need for exchanging endstations. Gas phase and solid state measurements can be performed simultaneously for highly accurate photon energy calibration.
- Gas Phase Time-of-Flight Spectroscopy - The TOF endstation from Madison has been refurbished and commissioned on the SGM in June 2006.
- X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) - The SGM photoemission endstation (Scienta 100 analyser) has been commissioned on the SGM and is now in routine use. Both high and low temperature experiments are possible with this chamber. Total energy resolution (analyzer + beamline) of 100 meV is easily obtainable. The chamber can also be used for total yield XAS and XEOL. Sample prep capability is, however, very limited, and the sample transfer non-trivial. Please contact beamline staff prior to any proposal submission.
Please discuss details of your experiment(s) with Tom Regier, 306-657-3733.
Beamline specifications can be viewed at http://www.lightsource.ca/experimental/sgm.php.
11ID-2 (VLS-PGM) Variable Line Spacing Plane Grating Monochromator Beamline:
Submit Proposal - all endstations
Status: Operational, accepting proposals
Anticipated capacity: The majority of shifts will be available for user experiments for the next cycle. Shifts will also be dedicated to commissioning and improving the performance of the beamline and the endstation development.
PGM Endstations and capabilities:
- X-ray Absorption Spectroscopy (XAS): The solid state chamber is capable of measuring the Total Electron Yield and the Fluorescence Yield simultaneously. The multiple-samples loading system allows users to load up to three sample holders and exchange them in less than five minutes. At present only room temperature experiments are possible. For light emitting materials, the photoluminescence yield is also possible with the XEOL apparatus.
- X-ray Excited Optical Luminescence (XEOL): XEOL can be performed using an in-vacuum lens in the solid state chamber. The system is fully integrated into the beamline software, allowing optical yield XAS as well as acquisition of individual optical spectra.
- Time-of-Flight System: The TOF endstation has been refurbished and commissioned on VLS-PGM in November 2007. For details on performance and capabilities of the system, please contact Mike MacDonald (mike.macdonald@lightsource.ca).
- XPEEM = Canadian Photoemission Research Spectromicroscope (CaPeRS): This is a commercial X-ray photoemission electron microscope capable of better than 50 nm spatial resolution on appropriate samples. In the fall of 2009 its energy analyzer was removed to provide a period of time without the analyzer, a configuration which provides higher sensitivity, but somewhat larger sampling depth. The X-PEEM chamber is attached to a UHV preparation chamber which includes several evaporation ports, a quartz crystal micro balance, ion sputtering and a LEED/Auger system. X-PEEM is accepting proposals on the SM and PGM beamlines. The PEEM will normally be scheduled on the PGM in one block per year, as demand warrants.
- X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) - The VLS-PGM photoemission endstation (Scienta 100 analyser) has been developed and the system's assembly was recently completed. Both high and low temperature experiments are possible with this chamber. Sample preparation capability is, however, very limited, and the sample transfer non-trivial. Please contact Xiaoyu Cui (Xiaoyu.Cui@lightsource.ca) prior to any proposal submission.
Please discuss details of your experiment(s) with Lucia Zuin, 306-657-3724.
Beamline specifications can be viewed at http://www.lightsource.ca/experimental/vlspgm.php
Last modified: 2012-01-30 14:01:43