Status |
Operational,
Accepting Proposals
|
Source |
75 mm generalized Apple II Elliptically Polarizing Undulator (EPU) |
Energy Range |
130 – 2500 eV |
Wavelength |
95 – 5 Å |
Energy Resolution (E/ΔE) |
3000-10000 |
Flux ( Ph/s/0.1%BW) @ 100 mA |
STMX: ~108 ph/s in 30 nm spot,
PEEM ~ 1012 ph/s in 50 µm spot |
Spot size:
|
35 nm
50 nm |
Description: The Spectromicroscopy (SM) beamline user group has strong research programs ranging from polymer science and biological applications to novel material design and magnetic imaging.
An Apple II type undulator provides an intense beam in the 130-2500eV energy range with user-specified polarization (varying from an arbitrary inclined linear polarization to circular polarization). An infinity corrected plane grating monochromator (PGM) with vertical dispersion plane is designed for a nominal resolving power of 3000 and flux as high as possible. The PGM works with collimated light and allows for the free choice of grating magnification parameters, providing the best compromise between energy resolution (approaching a resolving power of 7000), high order rejection and grating efficiency.
Endstation(s):
- Scanning Transmission X-ray Microscope (STXM) is an advanced microscope designed at the CLS, similar to a prototype which operated on Beamline 5.3.2.2 at the Advanced Light Source (Berkeley)
- PhotoElectron Emission Microscope (X-PEEM) that has been acquired commercially from Elmitec
Techniques:
- Scanning transmission X-ray Microscopy and Spectroscopy (STXM)
- Photoemission Electron microscopy and Spectroscopy (X-PEEM)
- Circular Polarization: 130 – 1000 eV
- Linear Polarization: 130 – 2500 eV
Optics: Entrance slit-less plane grating monochromator; a single grating substrate with three stripes. Optics allows easy switching between the two parallel endstations.
Technical beamline one-pager (PDF)
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Back Left to Right: Adam Hitchcock, Tolek Tyliszczak, Russ Berg, Tony Wilson, Stephen Urquhart Front Left to Right: Yingshen Lu, Jay Dynes, Chithra Karunakaran
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