| Overview |
Status |
Operational, Accepting
Proposals |
Source |
45 mm planar undulator |
Energy Range |
250 – 2000 eV |
Wavelength |
62 – 6.5Å |
Resolution E
/ ΔE
|
>5000
(below 1500 eV) |
Flux ( γ /s/0.1%BW) @ 100 mA |
4x1012 @ 250 eV
1 x1011@ 1900 eV |
Spot size (Horizontal x Vertical) |
1000 μm x 100 μm |
Description: The
beamline employs three diffraction gratings to provide users with
a very bright, highly monochromatic photon beam, tunable between 250
and 2000 eV. The beamline is ideal for solid sample or gas phase spectroscopy
but can be fitted with a variety of endstations.
Endstation(s):
- Absorption Chamber
- Gas Cell
- Scienta
- Time of Flight
Techniques:
- X-ray Absorption Spectroscopy (XAS)
- X-ray Photoelectron Spectroscopy (XPS)
- Auger Electron Spectroscopy (AES)
- X-ray Excited Optical Luminescence (XEOL)
- Gas phase photoionization and TOF measurements
Optics: Two horizontal deflecting mirrors and one vertical
focusing mirror direct the light from the undulator through the
entrance slit and onto the selected grating. The three gratings,
with line spacing of 600, 1100 and 1700 lines/mm, diffract the
light through a movable exit slit. A pair of toroidal refocusing
mirrors are used to focus the beam onto the sample areas.
Technical beamline one-pager (PDF)
|


Left to Right: Tom Regier; T.K. Sham; Missing: Robert Blyth |
|
| Contacts |
|
Beamline Scientist: Tom
Regier (306) 657-3733
Science
Associate: TBD
Beamline Team Leader: T.K.
Sham
Beamline Team Members (PDF)
Beamline Telephone: (306) 657-3612 |
Last modified: 2010-02-05 14:02:55