| Overview |
Status |
|
Source |
Bending Magnet |
Energy Range |
0.070 - 0.744 eV
(70 - 744 meV =
560 - 6000 cm-1) |
Wavelength |
17.8 - 1.7 μm |
Resolution ΔE |
16.0 – 0.125 cm -1 |
Flux ( ν /s/0.1%BW) @ 100 mA |
1 x 1014 @ 10 μm |
Spot size (Horizontal x Vertical) |
Diffraction Limited |
Description: The Mid Infrared Spectromicroscopy beamline
provides a state-of-the-art Fourier Transform IR spectrometer and
microscope to supply diffraction-limited spatial resolution to an
ever-widening range of infrared spectroscopy experiments. Research
and development will explore new experiments and re-examine existing
techniques by applying the advantages of high brightness infrared
synchrotron light.
Endstation(s):
- Bruker Optics IFS 66v/S FTIR with Hyperion confocal microscope/mapping stage
Techniques:
- Spectromicroscopy at diffraction-limited spatial resolution
- Photoacoustic Spectroscopy
- Polarization Modulation IR Spectromicroscopy
- Focal Plane Array (FPA) Microscopy for large area mapping
Techniques under Development:
- Spectromicroscopy at grazing angle of incidence
- Spectromicroscopy with Attenuated Total internal Reflection (ATR)
Optics: The first collecting mirror is in a specially designed
dipole vacuum chamber. Point-to-point focusing optics transfer the
IR light first through a thin diamond window that separates UHV
from rough vacuum, and then is relayed as a collimated beam into the
Bruker FTIR spectrometer and Hyperion microscope.
Technical beamline one-pager (PDF)
|

FTIR spectrometer and microscope in the beamline experimental hutch.

Left to Right: Kirk Michaelian, Tim May.

Mid IR Beamline rough vacuum section with collimating mirrors.

Kirk Michaelian working with the PAS cell. |
|
| Contacts |
Beamline Scientist: Ferenc Borondics (306) 657-3763
Science Associate: Tor Pedersen (306) 657-3783
Beamline Team Leader: Kirk Michaelian
Beamline Team Members (PDF)
Beamline Telephone: (306) 657-3607
|
Last modified: 2010-08-19 09:08:48