Beamlines
Techniques |
Status |
||
|
• Micro-XRD • X-ray Absorption Fine Structure (XAFS) • Resonant X-ray Emission Spectroscopy • X-ray Raman Scattering • Confocal X-ray Microscopy • Micro-fluorescence • Time-resolved X-ray Absorption Fine Structure • X-ray Emission Spectroscopy (commissioning) |
4.3 – 2.7 keV (Si111) 8 – 50 keV (Si311) |
|
|
|
• X-ray Absorption Fine Structure (XAFS) • Microfluorescence (Hard X-ray) • Time-resolved X-ray Excited Optical Luminescence • Diffraction Anomalous Fine Structure |
2.7 – 32.7 keV |
|
|
|
Beamlines include all XSD beamlines at the APS – please contact the PNCSRF beamline scientist for more information |
various |
|
|
|
• Conventional absorption imaging
• Phase contrast or in-line holography • Ultra-small, small, wide angle scattering imaging • Computer Tomography (CT) • Diffraction Enhanced Imaging (DEI) / Multiple Image Radiography (MIR) Critical Points to Address in a BMIT proposal |
8000 – 40000 | ||
Biomedical Imaging and Therapy (BMIT-ID) |
• Imaging - conventional absorption imaging, DEI / MIR, CT, K-edge Subtraction (KES) • Therapy - Microbeam Radiation Therapy, CT Therapy Critical Points to Address in a BMIT proposal |
20000 – 100000 |
|
Canadian Macromolecular Crystallography Facility (CMCF-BM) |
• Single Anomalous Dispersion (SAD) • X-ray diffraction • Multiwavelength Anomalous Dispersion (MAD) • XANES on crystals |
4000 to 18000 | |
Canadian Macromolecular Crystallography Facility (CMCF-ID) |
• Single crystal X-ray diffraction • Multiwavelength Anomalous Dispersion (MAD) • XANES on crystals |
6200 – 18000 | |
|
• Fourier Transform Absorption Spectroscopy |
0.00062 - 0.124 eV (0.62 - 124 meV = 5 - 1000 cm-1) |
||
|
• X-ray Absorption Fine Structure (XAFS) • Microprobe • Powder Diffraction • X-ray Scattering |
5000 – 40000 | ||
High Resolution Spherical Grating Monochromator (SGM) |
• X-ray Absorption Spectroscopy (XAS) • X-ray Photoelectron Spectroscopy (XPS) • Auger Electron Spectroscopy (AES) • X-ray Excited Optical Luminescence (XEOL) • Gas phase photoionization • TOF measurements |
240 - 2000 | |
|
• Spectromicroscopy at diffraction-limited spatial resolution • Photoacoustic Spectroscopy • Polarization Modulation IR Spectromicroscopy • Focal Plane Array (FPA) Microscopy for large area mapping Techniques under Development: •Spectromicroscopy at grazing angle of incidence •Spectromicroscopy with Attenuated Total internal Reflection (ATR) Critical Points to Address in a Mid-IR Proposal |
0.070 - 0.744 eV (70 - 744 meV = 560 - 6000 cm-1) |
||
Resonant Elastic and Inelastic X-ray Scattering (REIXS) |
• X-ray Absorption Spectroscopy (XAS) • X-ray Emission Spectroscopy (commissioning) • Resonant Inelastic X-ray Scattering (commissioning) • Resonant Elastic X-ray Scattering • Magnetic X-ray Dichroism • Molecular Beam Epitaxy sample preparation Critical Points to Address in a REIXS proposal |
80 – 2000 | |
|
• X-ray Absorption Spectroscopy (XAS) • X-ray Excited Optical Luminescence (XEOL) • X-ray Magnetic Linear Dichroism (XMLD) • Photoemission Electron Microscopy (PEEM) • X-ray Magnetic Circular Dichroism (XMCD) • Resonant spectroscopies • Photo and Auger Electron Spectroscopy • X-ray Absorption Fine Structure (XAFS) |
1700 – 10000 | ||
|
• Photoemission Electron Microscopy (PEEM) • Scanning transmission X-ray Microscopy (STXM) • Circular Polarization: 130 — 1000 eV • Linear Polarization: 130 — 2500 eV Critical Points to Address in an SM proposal |
130 – 2500 | ||
Synchrotron Laboratory for Micro And Nano Devices (SyLMAND) |
• Deep X-ray lithography • LIGA process lithography steps |
1000 – 15000 | |
Variable Line Spacing Plane Grating Monochromator (VLS PGM) |
• X-ray Absorption Spectroscopy (XAS) • X-ray Excited Optical Luminescence (XEOL) • Photoemission Electron Microscopy (PEEM) • X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) • Time of Flight (TOF) and gas phase photoionization measurements |
5.5 – 250 | |
Very Sensitive Elemental and Structural Probe Employing Radiation from a Synchrotron (VESPERS) |
• X-ray Laue Diffraction • X-ray Fluorescence Spectroscopy • X-ray Absorption Near Edge Structure • Differential Aperture X-ray Microscopy • Multi-bandpass and pink beam capability |
6000 – 30000 |
Last modified: 2013-05-03 16:05:59