Beamline |
Techniques |
Energy (eV) (cm-1 for IR) |
Status |
Far Infrared Spectroscopy
(Far-IR)
02B1-1 |
• Fourier Transform Absorption Spectroscopy
|
0.00062 - 0.124 eV
(0.62 - 124 meV = 5 - 1000 cm-1) |
|
Mid Infrared Spectromicroscopy (Mid-IR)
01B1-1 |
• Spectromicroscopy at diffraction-limited spatial resolution
• Photoacoustic Spectroscopy
|
0.070 - 0.744 eV
(70 - 744 meV = 560 - 6000 cm-1) |
|
Variable Line Spacing Plane Grating Monochromator (VLS PGM)
11ID-2 |
• X-ray Absorption Spectroscopy (XAS)
• X-ray Excited Optical Luminescence (XEOL)
• Photoemission Electron Microscopy (PEEM)
|
5.5 – 250 |
|
High Resolution Spherical Grating Monochromator (SGM)
11ID-1 |
• X-ray Absorption Spectroscopy (XAS)
• X-ray Photoelectron Spectroscopy (XPS)
• Auger Electron Spectroscopy (AES)
• X-ray Excited Optical Luminescence (XEOL)
• Gas phase photoionization
• TOF measurements
|
240 - 2000 |
|
Soft X-ray Spectromicroscopy (SM)
10ID-1 |
• Photoemission Electron Microscopy (PEEM)
• Scanning transmission X-ray Microscopy (STXM)
• Circular Polarization: 130 – 1000 eV
• Linear Polarization: 130 – 2500 eV
|
130 – 2500 |
|
Canadian Macromolecular Crystallography Facility (CMCF)
08ID-1 |
• Single crystal X-ray diffraction
• Multiwavelength Anomalous Dispersion (MAD)
• XANES on crystals
|
6200 – 18000 |
|
Hard X-ray MicroAnalysis (HXMA)
06ID-1 |
• X-ray Absorption Fine Structure (XAFS)
• Microprobe
• Powder Diffraction
• X-ray Scattering
|
5000 – 40000 |
|
Very Sensitive Elemental and Structural Probe Employing Radiation from a Synchrotron (VESPERS)
07B2-1 |
• X-ray Laue Diffraction
• X-ray Fluorescence Spectroscopy
• X-ray Absorption Near Edge Structure
• Differential Aperture X-ray Microscopy
• Multi-bandpass and pink beam capability
|
6000 – 30000 |
|
Resonant Elastic and Inelastic X-ray Scattering (REIXS)
10ID-2 |
• X-ray Absorption Spectroscopy (XAS)
• X-ray Emission Spectroscopy
• Resonant Inelastic X-ray Scattering
• Resonant Elastic X-ray Scattering
• Coherent X-ray Scattering (Speckle)
• Magnetic X-ray Dichroism
• Molecular Beam Epitaxy sample preparation
|
80 – 2000 |
Commissioning |
Soft X-ray Microcharacterization Beamline (SXRMB)
06B1-1 |
• X-ray Absorption Spectroscopy (XAS)
• X-ray Excited Optical Luminescence (XEOL)
• X-ray Magnetic Linear Dichroism (XMLD)
• Photoemission Electron Microscopy (PEEM)
• X-ray Magnetic Circular Dichroism (XMCD)
• Resonant spectroscopies
• Photo and Auger Electron Spectroscopy
|
1700 – 10000 |
|
Synchrotron Laboratory for Micro And Nano Devices (SyLMAND)
05B2-1 |
• Deep X-ray lithography
• LIGA process lithography steps
|
1000 – 15000 |
Under Construction |
Canadian Macromolecular Crystallography Facility (CMCF 2)
08B1-1 |
• X-ray diffraction
• Multiwavelength Anomalous Dispersion (MAD)
|
4000 to 18000 |
Under Construction |
Biomedical Imaging and Therapy (BMIT-BM)
05B1-1 |
• Conventional absorption imaging
• Phase contrast or in-line holography
• Ultra-small, small, wide angle scattering imaging
• Computer Tomography (CT)
• Diffraction Enhanced Imaging (DEI) / Multiple Image Radiography (MIR)
|
8000 – 40000 |
|
Biomedical Imaging and Therapy (BMIT-ID)
05ID-2 (POE-2 & SOE-1) |
• Imaging – conventional absorption imaging, DEI / MIR, CT, K-edge Subtraction (KES)
• Therapy – Microbeam Radiation Therapy, CT Therapy
|
20000 – 100000 |
Commissioning |
