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Introduction to Soft X-Ray Synchrotron Science of Soft Matter
June 2-3, 2005

This workshop is designed to inform users and potential users of several soft x-ray spectroscopy and microscopy techniques and their usefulness in studying systems composed of soft matter. Soft matter is defined as materials composed primarily, but not exclusively, of non-transition metal elements of relatively low density (e.g. C, N, O, Si, P, S).

Participants will be given an introduction to the principles and practice of these techniques and will then have an opportunity to see some of these techniques in practice on the experimental floor of the Canadian Light Source (CLS) at an operational soft x-ray beamline. Participants will then be treated to a number of talks presenting the experimental results using these techniques.

A second optional day for a maximum of 4 participants will be offered. These participants will have the opportunity to bring some of their own scientific samples to the CLS and be given a period of time (approximately 2-3 hours each) to take real scientific data on their own samples on an operational CLS soft x-ray beamline.

Those registrants interested in taking part in the second day are invited fill out a short form giving a brief description of their samples and research. Four participants will be selected, the participants will take a CLS safety orientation course and be registered as official CLS users prior to the workshop.

Invited Speakers:

Program

Registration form

Location:
Canadian Light Source, Room 2068

Date:
June 2, 2005 (20 participants)
June 3, 2005 (Optional 2nd day- maximum 4 participants

Contact:

For more information, or to register please contact ian.coulthard@lightsource.ca

Last modified: 2012-01-19 17:01:07