Hard X-ray MicroAnalysis (HXMA) 06ID-1

Overview

The Hard X-ray Micro-Analysis (HXMA) beamline at CLS 06ID-1 is a multipurpose hard X-ray beamline, based on a 63 pole superconducting wiggler. HXMA has been designed to provide the community with XAFS, and diffraction/scattering capabilities.

For XAFS, in addition to the standard ionization chamber and Lytle detectors, a single element and 4 elements Vortex silicon drift detector and a 30 element Ge detector are available.  Proposal for the X-ray diffraction capabilities with 8-circle psi diffractometer and power X-ray diffraction with MAR345 image plate are being accepted.

  • Status

    Accepting Proposals

  • Source

    Superconducting Wiggler

  • Energy Range

    5-40 keV

  • Resolution ΔE/E

    10-4

  • Flux (y/s/0.1%BW) @ 100 mA

    XAFS, Diffraction: 1012 @ 12 keV

  • Spot Size (HxV)

    XAFS, Diffraction: 0.8mm x 1.5 mm2

Contacts

Senior Scientist - Beamline Responsible: Ning Chen 306-657-3571
Senior Scientist: Chang-Yong Kim 306-657-3765
Support Scientist: Weifeng Chen 306-657-3829 
Beamteam Leader: De-Tong Jiang 
Beamline Telephone: 306-657-3611
 

Optics

The primary beamline optics include a 1.2 m water-cooled silicon collimating mirror (seperate Rh and Pt coating stripes), a liquid nitrogren cooled double crystal monochromator (Kohzu CMJ-1) housing two crystal pairs [Si (111) and Si (220)], and a 1.15 m long water-cooled silicon toroidal focusing mirror (separate Rh and Pt coating stripes). These mirrors are equipped with dynamical meridian benders. 
 

HXMA Endstations and Capabilities

  • X-ray Absorption Fine Structure (XAFS): ionization chamber detectors and fluorescence detectors (i.e., Lytle, 4 element vortex, and 30 element Ge detector) for standard transmission and fluorescence mode EXAFS; cryostats for variable temperature sample environment (10 K - 300 K).
  • Powder X-ray diffraction: high pressure and ambient condition powder diffraction with MAR345 image plate area detector;
  • X-ray diffraction (XRD):  Resonance X-ray Diffraction (RXD); Polarization Analysis; Grazing Incidence X-ray Diffraction (GIXRD); Grazing Incidence Small Angle X-ray Scattering (GISAXS). Available equipments are Huber psi-8 diffractometer, CCD X-ray detector,  Four element Vortex silicon drift detector, closed cycle cryostat (10 K - 450 K), Be-dome (UHV - ambient pressure, 300 K - 800 K), in-situ flow-reactor/furnace cell (300K – 1200 K), heating-cooling stage (80 K - 620 K).
Please discuss details of your experiment(s) prior to submitting with Ning Chen, 306-657-3571 (XAFS capabilities) and Chang-Yong Kim, 306-657-3765 (X-ray Diffraction).

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